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Development of electronic shearography for vibration analysis
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 Title & Authors
Development of electronic shearography for vibration analysis
Kang, Young-June; Kwon, Yong-Ki;
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 Abstract
This paper describes a measuring method of vibration mode shapes by the Electronic Shearography. This method called the speckle interferometer has many merits in practical use, such as low sensitivity to environmental noise, low limit of coherent-length and simple optical configuration. In this study, we developed Michelson-type shearing interferometer provided with a phase stepping mirror and with a bias modulation mirror to quantify the vibration gradient fields. Results of application to a simple cantilever plate show that the vibration amplitude fields obtained are in good agreement with those of the electronic speckle pattern interferometry (ESPI).
 Keywords
Electronic Shearography;Vibration Mode Shape;Vibration Gradient;Electronic Speckle Pattern Interferometry;
 Language
Korean
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