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Two-Wavelength Phase-Shifting Projection Topography for Measurement of Three-Dimensional Profiles with High Step Discontinuities
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 Title & Authors
Two-Wavelength Phase-Shifting Projection Topography for Measurement of Three-Dimensional Profiles with High Step Discontinuities
Kim, Seung-Woo; Oh, Jung-Taek; Jung, Moon-Sik; Choi, Yi-Bae;
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 Abstract
[] technique is now being extensively investigated as a fast non-contact means of three-dimensional profile measurement especially for reverse engineering. One problem with technique is so called -ambiguity problem that limits the maximum step height difference between two neighboring sampling points to be less than half the equivalent wavelength of fringes. In this investigation, a new two-wavelength scheme of projection topography is proposed and tested to cope with the -ambiguity problem. Experimental results are discussed to assess the new method in measuring large objects with high step discontinuities.
 Keywords
Projection topography;Two-Frequency Interferometry;Phase-Shifting Fringe Analysis;Three-Dimensional Profile Measurement;Reverse Engineering;
 Language
Korean
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