Two-Wavelength Phase-Shifting Projection $\small{Moir\acute{e}}$ Topography for Measurement of Three-Dimensional Profiles with High Step Discontinuities

Title & Authors
Two-Wavelength Phase-Shifting Projection $\small{Moir\acute{e}}$ Topography for Measurement of Three-Dimensional Profiles with High Step Discontinuities
Kim, Seung-Woo; Oh, Jung-Taek; Jung, Moon-Sik; Choi, Yi-Bae;

Abstract
[$\small{Moir\acute{e}}$] technique is now being extensively investigated as a fast non-contact means of three-dimensional profile measurement especially for reverse engineering. One problem with $\small{moir\acute{e}}$ technique is so called $\small{2\pi}$-ambiguity problem that limits the maximum step height difference between two neighboring sampling points to be less than half the equivalent wavelength of $\small{moir\acute{e}}$ fringes. In this investigation, a new two-wavelength scheme of projection $\small{moir\acute{e}}$ topography is proposed and tested to cope with the $\small{2\pi}$-ambiguity problem. Experimental results are discussed to assess the new method in measuring large objects with high step discontinuities.
Keywords
Projection $\small{Moir\acute{e}}$ topography;Two-Frequency Interferometry;Phase-Shifting Fringe Analysis;Three-Dimensional Profile Measurement;Reverse Engineering;
Language
Korean
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