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Automatic On-Chip Glitch-Free Backup Clock Changing Method for MCU Clock Failure Protection in Unsafe I/O Pin Noisy Environment
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 Title & Authors
Automatic On-Chip Glitch-Free Backup Clock Changing Method for MCU Clock Failure Protection in Unsafe I/O Pin Noisy Environment
An, Joonghyun; Youn, Jiae; Cho, Jeonghun; Park, Daejin;
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 Abstract
The embedded microcontroller which is operated by the logic gates synchronized on the clock pulse, is gradually used as main controller of mission-critical systems. Severe electrical situations such as high voltage/frequency surge may cause malfunctioning of the clock source. The tolerant system operation is required against the various external electric noise and means the robust design technique is becoming more important issue in system clock failure problems. In this paper, we propose on-chip backup clock change architecture for the automatic clock failure detection. For the this, we adopt the edge detector, noise canceller logic and glitch-free clock changer circuit. The implemented edge detector unit detects the abnormal low-frequency of the clock source and the delay chain circuit of the clock pulse by the noise canceller can cancel out the glitch clock. The externally invalid clock source by detecting the emergency status will be switched to back-up clock source by glitch-free clock changer circuit. The proposed circuits are evaluated by Verilog simulation and the fabricated IC is validated by using test equipment electrical field radiation noise
 Keywords
safety;clock failure protection;glitch-free clock switch;noise cancel;
 Language
Korean
 Cited by
 References
1.
R.Mariani, P. Fuhrmann, and B.Vittorelli, "Fault-robust microcontrollers for automotiveapplications," in On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International, 0-0 2006, p. 6 pp

2.
G. Buja and R.Menis, "Dependability and functional safety: Applications in industrial electronics systems," Industrial Electronics Magazine, IEEE, vol. 6, no. 3, pp. 4 -12, sept. 2012.

3.
H. Gall, "Functional safety iec 61508 / iec 61511 the impact to certification and the user," in Computer Systems and Applications, 2008. AICCSA 2008. IEEE/ACS International Conference on, March 2008, pp. 1027-1031.

4.
S. Ben Dhia, S. Baffreau, S. Calvet, and E. Sicard, "Characterisation of microcontroller electromagnetic emission: models for an international standard," in Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on, 2002, pp. I030-I1-8.

5.
T. Tamandl and P. Preininger, "Online Self Tests for Microcontrollers in Safety Related Systems," 2007 5th IEEE International Conference on Industrial Informatics, vol. 1, pp. 137-142, 2007.

6.
W. Lyons., "Enabling increased safety with fault robustness in microcontroller applications," ARM Corporation, 2009.

7.
S. A. Skavhaug and O. Pettersen, "Micro-FaultTolerant (${\mu}FT$)-a system for achieving cost effective fault tolerance in microcontroller based equipment," in Real-Time Systems, 1995. Proceedings., Seventh Euromicro Workshop on. IEEE Computer Soc. Press, 1995, pp. 344-351.

8.
D. Park and T. G. Kim, "Safe memory read-path using silent crc calculation of binary bit-inversion for low-power fast rom integrity verifcation," in Consumer Electronics in Berlin (ICCE-Berlin), 2013. ICCE-Berlin 2013. IEEE Third International Conference on, Sept 2013, pp. 300- 313.

9.
C. Metra, M. Omana, T. Mak, and S. Tam, "New design for testability approach for clock fault testing," Computers, IEEE Transactions on, vol. 61, no. 4, pp. 448-457, april 2012. crossref(new window)

10.
I. E. Commission, "IEC-60730 official website," in Specification 60730-2, 2015. [Online]. Available: http://www.iec.ch

11.
H.-N. Lin, C.-W. Kuo, C. kuo Chen, and J.-S. Chen, "Analysis of emi effect on flash memory ic," in Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on, may 2012, pp. 757 -760.

12.
J. An, J. Cho, and D. Park, "On-chip glitch-free backup clock changer using noise canceller and edge detector for automatic mcu clock failure protection," in The 10th International Symposium on Embedded Technology, Jun. 2015, pp. 38.39.

13.
H. Wang, Y. Zhang, X. Li, L. Chen, Z. Wen, K. Zhang, and M. Wang, "A configurable fault-tolerant glitch-free clock switching circuit," in Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on, Aug 2013, pp. 537-540.