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Design and Analysis of an Accelerated Life Test for Magnetic Contactors
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 Title & Authors
Design and Analysis of an Accelerated Life Test for Magnetic Contactors
Ryu, Haeng-Soo; Park, Sang-Yong; Han, Gyu-Hwan; Kwon, Young-Il; Yoon, Nam-Sik;
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 Abstract
Magnetic contactors (MCs) are widely used in industrial equipment such as elevators, cranes and factory control rooms in order to close and open the control circuits. The reliability of MCs mainly depend on mechanical durability and international standards such as IEC 60947-4-1, which stipulates the testing method for MCs. Testing time, however, is so long in usual cases that a method of reducing testing time is required. Therefore, a temperature and voltage-accelerated life testing (ALT) method has been developed to reduce the testing time in this work. The accelerated life test data are analyzed and acceleration factors (AFs) are provided.
 Keywords
Magnetic contactor;Accelerated life test;MINITAB;Weibull distribution;Acceleration factor;
 Language
English
 Cited by
1.
The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor,;;;

Journal of Electrical Engineering and Technology, 2008. vol.3. 2, pp.184-191 crossref(new window)
2.
Basic Study of Degradation Test for Magnetic Contactors and Reliability Centered Maintenance,;;;

Journal of Electrical Engineering and Technology, 2007. vol.2. 4, pp.441-444 crossref(new window)
1.
Novel Electromagnetic Actuator Using a Permanent Magnet and an Inter-Locking Mechanism for a Magnetic Switch, IEEE Transactions on Magnetics, 2013, 49, 5, 2229  crossref(new windwow)
 References
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Wayne Nelson, 'Accelerated Testing-Statistical Models' Test Plans, and Data Analyses, Ed. New York: John Wiley & Sons, 1990, pp. 63–4

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Anderson, Sweeney, Williams, 'Modern Business Statistics' Ed. Ohio: South-Western, 2003

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IEC International standard for Contactors and motor-starters-Electromechanical contactors and motor-starters (Standards style), IEC International Standard 60947-4-1, 2005

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H. S. Ryu, S. Y. Park, G. H. Han, Y. I. Kwon, N. S. Yoon, 'To Ensure A Product Reliability The Study on Accelerated Stress Tests for Magnetic Switch Used In Power Distribution System' in Proc. 36 th Summer Annu. Conf. KIEE, Korea, 2005, pp. 377-380