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Design and Analysis of an Accelerated Life Test for Magnetic Contactors
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 Title & Authors
Design and Analysis of an Accelerated Life Test for Magnetic Contactors
Ryu, Haeng-Soo; Park, Sang-Yong; Han, Gyu-Hwan; Kwon, Young-Il; Yoon, Nam-Sik;
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Magnetic contactors (MCs) are widely used in industrial equipment such as elevators, cranes and factory control rooms in order to close and open the control circuits. The reliability of MCs mainly depend on mechanical durability and international standards such as IEC 60947-4-1, which stipulates the testing method for MCs. Testing time, however, is so long in usual cases that a method of reducing testing time is required. Therefore, a temperature and voltage-accelerated life testing (ALT) method has been developed to reduce the testing time in this work. The accelerated life test data are analyzed and acceleration factors (AFs) are provided.
Magnetic contactor;Accelerated life test;MINITAB;Weibull distribution;Acceleration factor;
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