A study on target Sigma Level at R&D stage and robust limits for design margins

- Journal title : Korean Journal of Applied Statistics
- Volume 29, Issue 2, 2016, pp.369-379
- Publisher : The Korean Statistical Society
- DOI : 10.5351/KJAS.2016.29.2.369

Title & Authors

A study on target Sigma Level at R&D stage and robust limits for design margins

Ko, Seoung-gon;

Ko, Seoung-gon;

Abstract

The Sigma Level, proposed by Motorola Inc., is one of the many Process Capability Index (PCI)'s that have been presented since the 1970's. It is used to evaluate process capability and unlike other PCI's, it has an advantage in that it uses population probability distribution. However, it is originally designed for mass production and is inadequate to evaluate prototypes or early products in the R&D stages. For use in such cases, we propose an R&D target Sigma Level, derived by considering 1.5 sigma shifts in traditional sigma level from a statistical point of view. We also explain the way to find robust limits for design tolerance because the sigma level or defect probability is useful to establish economical tolerance limits at the R&D stage and mass production.

Keywords

Process Capability Index(PCI);Sigma Level;R&D Sigma Level;1.5 sigma shift;robust limits;design tolerance;

Language

Korean

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