Verification of Reliability by the Induced Voltage of a Downscaled and Simulated 22.9kV-Y Distribution Line

Title & Authors
Verification of Reliability by the Induced Voltage of a Downscaled and Simulated 22.9kV-Y Distribution Line
Kim, Jeom-Sik; Choi, Chung-Seog;

Abstract
The purpose of this paper is to measure the induced voltage of the downscaled and simulated overhead ground wire of a 22.9kV-Y distribution line. This study performed a test of the downscaled and simulated distribution line according to whether it is grounded or not and the value of the ground resistance. In order to verify the reliability of the data measured by the test, the data was analyzed using the Minitab 17 program. It was found that the induced voltage of the downscaled and simulated distribution line is influenced by the value of the ground resistance. It was also found that the ground resistance obtained at a certain point is closely related to whether electric poles are grounded or not. The analysis results of the measured test data with a statistical method showed that the Anderson Darling (AD) was analyzed to be the smallest as 0.188 when the ground resistance of the electric poles had been maintained at $\small{10{\Omega}}$. In addition, the P value analyzed to be 0.894 which is in the proximity of the theoretical value of 1 and verified the reliability of the test data. It could be seen that the data measured by the downscaled simulation test forms a linear graph. It is thought that if a distribution line is installed in the same manner as the downscaled, simulated distribution line, the mean induced voltage will be reduced and reliability will be increased.
Keywords
reliability;induced voltage;22.9 kV-Y distribution line;ground wire;grounding;minitab 17;
Language
Korean
Cited by
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