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Fabrication of Nickel Oxide Film Microbolometer Using Amorphous Silicon Sacrificial Layer
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 Title & Authors
Fabrication of Nickel Oxide Film Microbolometer Using Amorphous Silicon Sacrificial Layer
Kim, Ji-Hyun; Bang, Jin-Bae; Lee, Jung-Hee; Lee, Yong Soo;
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 Abstract
An infrared image sensor is a core device in a thermal imaging system. The fabrication method of a focal plane array (FPA) is a key technology for a high resolution infrared image sensor. Each pixels in the FPA have membranes including legs to deposit bolometric materials and electrodes on Si readout circuits (ROIC). Instead of polyimide used to form a sacrificial layer, the feasibility of an amorphous silicon () was verified experimentally in a micro-bolometer array with a pitch. The elimination of the polyimide sacrificial layer hardened by a following plasma assisted deposition process is sometimes far from perfect, and thus requires longer plasma ashing times leading to the deformation of the membrane and leg. Since the amorphous Si could be removed in gas at room temperature, however, the fabricated micro-bolomertic structure was not damaged seriously. A radio frequency (RF) sputtered nickel oxide film was grown on a membrane fabricated using a low stress silicon nitride (LSSiN) technology with a LPCVD system. The deformation of the membrane was effectively reduced by a combining the and LSSiN process for a nickel oxide micro-bolometer.
 Keywords
Infrared sensor;Amorphous silicon;Nickel oxide;MEMS technology;Low stress silicon nitride;Sandwich structure;
 Language
Korean
 Cited by
 References
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