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A Study on the Promotion of Reliability Test for Imbedded Software of Weapon System
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 Title & Authors
A Study on the Promotion of Reliability Test for Imbedded Software of Weapon System
Heo, Kon Yi; Kwon, Kyoug Yong; Kim, Tae Sik;
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It has been tested for SW reliability in order to prevent the SW error during the development of weapons systems. According to a recent report, defects such as memory leak, buffer overflow, and null deference occur usually in the development stage, but also in the mass production stage. Although it is intended to enhance the SW test and evaluation to prevent SW failures in the development stage, the non-functional problems like syntax errors are not completely revised due to the limitation of the schedule and costs. In addition, SW failure rate are usually fluctuated by the operational environment through SW upgrade in contrast with HW. In this paper, we propose a method to increase SW reliability in the mass production stage of Korean weapon systems.
SW Reliability Test;Static Analysis;Weapon System;Acquisition;Low Rate Initial Production;
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