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A Fast Way for Alignment Marker Detection and Position Calibration
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 Title & Authors
A Fast Way for Alignment Marker Detection and Position Calibration
Moon, Chang Bae; Kim, HyunSoo; Kim, HyunYong; Lee, Dongwon; Kim, Tae-Hoon; Chung, Hae; Kim, Byeong Man;
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 Abstract
The core of the machine vision that is frequently used at the pre/post-production stages is a marker alignment technology. In this paper, a method to detect the angle and position of a product at high speed by use of a unique pattern present in the marker stamped on the product, and calibrate them is proposed. In the proposed method, to determine the angle and position of a marker, the candidates of the marker are extracted by using a variation of the integral histogram, and then clustering is applied to reduce the candidates. The experimental results revealed about 5s 719ms improvement in processing time and better precision in detecting the rotation angle of a product.
 Keywords
Alignment Marker;Template Matching;Integral Histogram;Candidate Clustering;Projection Integral Histogram;
 Language
Korean
 Cited by
 References
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