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Improvement of Alignment Accuracy in Electron Tomography
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  • Journal title : Applied Microscopy
  • Volume 43, Issue 1,  2013, pp.1-8
  • Publisher : Korean Society of Electron Microscopy
  • DOI : 10.9729/AM.2013.43.1.1
 Title & Authors
Improvement of Alignment Accuracy in Electron Tomography
Jou, Hyeong-Tae; Lee, Sujeong; Kim, Han-Joon;
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 Abstract
We developed an improved method for tilt series alignment with fiducial markers in electron tomography. Based on previous works regarding alignment, we adapted the Levenberg-Marquardt method to solve the nonlinear least squares problem by incorporating a new formula for the alignment model. We also suggested a new method to estimate the initial value for inversion with higher accuracy. The proposed approach was applied to geopolymers. A better alignment of the tilt series was achieved than that by IMOD S/W. The initial value estimation provided both stability and a good rate of convergence since the new method uses all marker positions, including those partly covering the tilt images.
 Keywords
Electron tomography;Geopolymer;Alignment;Fiducial marker;
 Language
English
 Cited by
1.
Electron Tomography and Synapse Study,;;;

Applied Microscopy, 2014. vol.44. 3, pp.83-87 crossref(new window)
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