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Technical Investigation into the In-situ Electron Backscatter Diffraction Analysis for the Recrystallization Study on Extra Low Carbon Steels
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  • Journal title : Applied Microscopy
  • Volume 43, Issue 2,  2013, pp.88-97
  • Publisher : Korean Society of Electron Microscopy
  • DOI : 10.9729/AM.2013.43.2.88
 Title & Authors
Technical Investigation into the In-situ Electron Backscatter Diffraction Analysis for the Recrystallization Study on Extra Low Carbon Steels
Kim, Ju-Heon; Kim, Dong-Ik; Kim, Jong Seok; Choi, Shi-Hoon; Yi, Kyung-Woo; Oh, Kyu Hwan;
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 Abstract
Technical investigation to figure out the problems arising during in-situ heating electron backscatter diffraction (EBSD) analysis inside scanning electron microscopy (SEM) was carried out. EBSD patterns were successfully acquired up to without degradation of EBSD pattern quality in steels. Several technical problems such as image drift and surface microstructure pinning were taking place during in-situ experiments. Image drift problem was successfully prevented in constant current supplying mode. It was revealed that the surface pinning problem was resulted from the oxide particle formation during heating inside SEM chamber. Surface pinning phenomenon was fairly reduced by additional platinum and carbon multi-layer coating before in-situ heating experiment, furthermore was perfectly prevented by improvement of vacuum level of SEM chamber via leakage control. Plane view in-situ observation provides better understanding on the overall feature of recrystallization phenomena and cross sectional in-situ observation provides clearer understanding on the recrystallization mechanism.
 Keywords
Electron backscatter diffraction;In-situ heating;Surface pinning;Interstitial free steel;Recrystallization;
 Language
English
 Cited by
1.
Microstructural Evolution of X20CrMoV12.1 Steel upon Short-term Creep Rupture Test,;;;;;

Applied Microscopy, 2013. vol.43. 4, pp.164-172 crossref(new window)
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