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Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method
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  • Journal title : Applied Microscopy
  • Volume 44, Issue 4,  2014, pp.133-137
  • Publisher : Korean Society of Electron Microscopy
  • DOI : 10.9729/AM.2014.44.4.133
 Title & Authors
Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method
Cho, Youngji; Yang, Jun-Mo; Lam, Do Van; Lee, Seung-Mo; Kim, Jae-Hyun; Han, Kwan-Young; Chang, Jiho;
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 Abstract
We suggest a facile transmission electron microscopy (TEM) specimen preparation method for the direct (polymer-free) transfer of layer-area graphene from Cu substrates to a TEM grid. The standard (polymer-based) method and direct transfer method were by TEM, high-resolution TEM, and energy dispersive X-ray spectroscopy (EDS). The folds and crystalline particles were formed in a graphene specimen by the standard method, while the graphene specimen by the direct method with a new etchant solution exhibited clean and full coverage of the graphene surface, which reduced several wet chemical steps and accompanying mechanical stresses and avoided formation of the oxide metal.
 Keywords
Graphene;Transmission electron microscopy;Specimen preparation;
 Language
English
 Cited by
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