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Reconstruction of Neural Circuits Using Serial Block-Face Scanning Electron Microscopy
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  • Journal title : Applied Microscopy
  • Volume 46, Issue 2,  2016, pp.100-104
  • Publisher : Korean Society of Electron Microscopy
  • DOI : 10.9729/AM.2016.46.2.100
 Title & Authors
Reconstruction of Neural Circuits Using Serial Block-Face Scanning Electron Microscopy
Kim, Gyu Hyun; Lee, Sang-Hoon; Lee, Kea Joo;
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Electron microscopy is currently the only available technique with a spatial resolution sufficient to identify fine neuronal processes and synaptic structures in densely packed neuropil. For large-scale volume reconstruction of neuronal connectivity, serial block-face scanning electron microscopy allows us to acquire thousands of serial images in an automated fashion and reconstruct neural circuits faster by reducing the alignment task. Here we introduce the whole reconstruction procedure of synaptic network in the rat hippocampal CA1 area and discuss technical issues to be resolved for improving image quality and segmentation. Compared to the serial section transmission electron microscopy, serial block-face scanning electron microscopy produced much reliable three-dimensional data sets and accelerated reconstruction by reducing the need of alignment and distortion adjustment. This approach will generate invaluable information on organizational features of our connectomes as well as diverse neurological disorders caused by synaptic impairments.
Electron microscopy;Hippocampus;Synapse;Connectomics;Mapping;
 Cited by
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Current Status of Automatic Serial Sections for 3D Electron Microscopy, Applied Microscopy, 2017, 47, 1, 3  crossref(new windwow)
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