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Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
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 Title & Authors
Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
Lim, Heonsang; Lim, Dae-Eun;
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Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.
Accelerated Degradation Test;Gamma Process;Optimal Plan;Maximum Likelihood Estimation;
 Cited by
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