JOURNAL BROWSE
Search
Advanced SearchSearch Tips
Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
facebook(new window)  Pirnt(new window) E-mail(new window) Excel Download
 Title & Authors
Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
Lim, Heonsang; Lim, Dae-Eun;
  PDF(new window)
 Abstract
Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.
 Keywords
Accelerated Degradation Test;Gamma Process;Optimal Plan;Maximum Likelihood Estimation;
 Language
Korean
 Cited by
1.
Literature Review on the Reliability in KSQM for 50 Years, Journal of the Korean society for quality management, 2016, 44, 1, 29  crossref(new windwow)
 References
1.
Boulanger, Michele, and Escobar, Luis A. 1994. "Experimental Design for a Class of Accelerated Degradation Tests." Technometrics 36(3):260-272. crossref(new window)

2.
Lawless, Jerald F. 1982. Statistical Models and Methods for Life Data, 1st ed. New York: Wiley.

3.
Li, Qishan, and Kececioglu, Dimitri B. 2004. "Optimal Design of Accelerated Degradation Tests." International Journal of Materials and Product Technology 20(1-3):73-90. crossref(new window)

4.
Li, Qishan, and Kececioglu, Dimitri B. 2006. "Design of an Optimal Plan for an Accelerated Degradation Test: A Case Study." International Journal of Quality and Reliability Management 23(4):426-440. crossref(new window)

5.
Liao, Chen-Mao, and Tseng, Sheng Tsaing. 2006. "Optimal Design for Step-Stress Accelerated Degradation Tests." IEEE Transactions on Reliability 55(1):59-66. crossref(new window)

6.
Liao, Haitao, and Elsayed, E. A. 2004. "Reliability Prediction and Testing Plan on an Accelerated Degradation Rate Model." International Journal of Materials Product Technology 21(5):402-422. crossref(new window)

7.
Lim, Heonsang. 2012. "Optimal Design of Accelerated Degradation Tests under the Constraint of Total Experimental Cost in the Case that the Degradation Characteristic Follows a Wiener Process." Journal of the Korean society for quality management 40(2):117-126. crossref(new window)

8.
Lim, Heonsang, and Yum, Bong-Jin. 2011. "Optimal Design of Accelerated Degradation Tests based on Wiener Process Models." Journal of Applied Statistics 38(2):309-325. crossref(new window)

9.
Meeker, William Q., and Escobar, Luis A. 1998. Statistical Methods for Reliability Data. New York: John Wiley & Sons.

10.
Nelson, W. 1990. Accelerating Test: Statistical Models, Test Plans and Data Analysis. New York: John Wiley & Sons.

11.
Pan, Zhengqiang, and Sun, Quan. 2014. "Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes." Communication in Statistics- Simulation and Computation 43(2):298-314. crossref(new window)

12.
Park, Chanseok, and Padgett, W. J. 2005. "Accelerated Degradation Models for Failure based on Geometric Brownian Motion and Gamma Processes." Lifetime Data Analysis 11(4):511-527. crossref(new window)

13.
Park, Jong-In, and Yum, Bong-Jin. 1997. "Optimal Design of Accelerated Degradation Tests for Estimating Mean Lifetime at the Use Condition." Engineering Optimization 28(3):199-230. crossref(new window)

14.
Park, Sang-Jun, and Yum, Bong-Jin. 2004. "Optimal Design of Step-Stress Degradation Tests in the Case of Destructive Measurement." Quality Technology and Quantitative Management 1(1):105-124.

15.
Shi, Ying, Escobar, Luis A., and Meeker, William Q. 2009. "Accelerated Destructive Degradation Test Planning." Technometrics 51(1):1-13. crossref(new window)

16.
Tang, Loon-Ching, Yang, G. Y., and Xie, Min. 2004. "Planning of Step-Stress Accelerated Degradation Test." Proceedings of the 50th Annual Reliability and Maintainability Symposium, Los Angeles, CA.

17.
Tseng, Sheng-Tsaing, Balakrishnan, Narayanaswamy, and Tsai, Chih-Chun. 2009. "Optimal Design Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes." IEEE Transactions on Reliability 58(4):611-618. crossref(new window)