JOURNAL BROWSE
Search
Advanced SearchSearch Tips
Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
facebook(new window)  Pirnt(new window) E-mail(new window) Excel Download
 Title & Authors
Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process
Lim, Heonsang; Lim, Dae-Eun;
  PDF(new window)
 Abstract
Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.
 Keywords
Accelerated Degradation Test;Gamma Process;Optimal Plan;Maximum Likelihood Estimation;
 Language
Korean
 Cited by
1.
품질경영학회 50주년 특별호: 신뢰성 분야 연구 리뷰,성시일;김용수;문병민;배석주;

품질경영학회지, 2016. vol.44. 1, pp.29-42 crossref(new window)
 References
1.
Boulanger, Michele, and Escobar, Luis A. 1994. "Experimental Design for a Class of Accelerated Degradation Tests." Technometrics 36(3):260-272. crossref(new window)

2.
Lawless, Jerald F. 1982. Statistical Models and Methods for Life Data, 1st ed. New York: Wiley.

3.
Li, Qishan, and Kececioglu, Dimitri B. 2004. "Optimal Design of Accelerated Degradation Tests." International Journal of Materials and Product Technology 20(1-3):73-90. crossref(new window)

4.
Li, Qishan, and Kececioglu, Dimitri B. 2006. "Design of an Optimal Plan for an Accelerated Degradation Test: A Case Study." International Journal of Quality and Reliability Management 23(4):426-440. crossref(new window)

5.
Liao, Chen-Mao, and Tseng, Sheng Tsaing. 2006. "Optimal Design for Step-Stress Accelerated Degradation Tests." IEEE Transactions on Reliability 55(1):59-66. crossref(new window)

6.
Liao, Haitao, and Elsayed, E. A. 2004. "Reliability Prediction and Testing Plan on an Accelerated Degradation Rate Model." International Journal of Materials Product Technology 21(5):402-422. crossref(new window)

7.
Lim, Heonsang. 2012. "Optimal Design of Accelerated Degradation Tests under the Constraint of Total Experimental Cost in the Case that the Degradation Characteristic Follows a Wiener Process." Journal of the Korean society for quality management 40(2):117-126. crossref(new window)

8.
Lim, Heonsang, and Yum, Bong-Jin. 2011. "Optimal Design of Accelerated Degradation Tests based on Wiener Process Models." Journal of Applied Statistics 38(2):309-325. crossref(new window)

9.
Meeker, William Q., and Escobar, Luis A. 1998. Statistical Methods for Reliability Data. New York: John Wiley & Sons.

10.
Nelson, W. 1990. Accelerating Test: Statistical Models, Test Plans and Data Analysis. New York: John Wiley & Sons.

11.
Pan, Zhengqiang, and Sun, Quan. 2014. "Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes." Communication in Statistics- Simulation and Computation 43(2):298-314. crossref(new window)

12.
Park, Chanseok, and Padgett, W. J. 2005. "Accelerated Degradation Models for Failure based on Geometric Brownian Motion and Gamma Processes." Lifetime Data Analysis 11(4):511-527. crossref(new window)

13.
Park, Jong-In, and Yum, Bong-Jin. 1997. "Optimal Design of Accelerated Degradation Tests for Estimating Mean Lifetime at the Use Condition." Engineering Optimization 28(3):199-230. crossref(new window)

14.
Park, Sang-Jun, and Yum, Bong-Jin. 2004. "Optimal Design of Step-Stress Degradation Tests in the Case of Destructive Measurement." Quality Technology and Quantitative Management 1(1):105-124. crossref(new window)

15.
Shi, Ying, Escobar, Luis A., and Meeker, William Q. 2009. "Accelerated Destructive Degradation Test Planning." Technometrics 51(1):1-13. crossref(new window)

16.
Tang, Loon-Ching, Yang, G. Y., and Xie, Min. 2004. "Planning of Step-Stress Accelerated Degradation Test." Proceedings of the 50th Annual Reliability and Maintainability Symposium, Los Angeles, CA.

17.
Tseng, Sheng-Tsaing, Balakrishnan, Narayanaswamy, and Tsai, Chih-Chun. 2009. "Optimal Design Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes." IEEE Transactions on Reliability 58(4):611-618. crossref(new window)