Publisher : Korean Institute of Intelligent Systems
DOI : 10.5391/JKIIS.2015.25.6.542
Title & Authors
SSD Test case generation method for early defect detection Son, Myeong-Gyu; Lee, Jee-Hyong;
Usually, a new SSD (Solide State Drive) product is developed based on the software platform of the previous product. Therefore, when using the same test case was used to evaluate the previous generation evaluation of new products are a number of advantages may be, but a priority or weight is the inefficiency exists in the use of the evaluation resources due to not considered. A new method is proposed to prevent the waste of testing resources. Through the analysis of the evaluation data for the previous products, the combinations of testing cases with the highest probability for defect detections are identified. When the software is to be reused, most part of the base software platform is rarely modified and only some modules are added or modified. So, the whole software system may have similar types of defects with the previous products. By utilizing the evaluation data for the previous proucts, we can detect defects at an early stage.
SSD;Test Case;Defect detection;Black box testing;Experience based testing;
C. Bishop, "Pattern Recognition and Machine Learning", Springer 2006.
Karel Dejaeger, Thomas Verbraken and Bart Baesens, "Toward Comprehensible Software Fault Prediction Models Using Bayesian Network Classifiers", IEEE Transactions of Software Engineering, 39(2), February 2013.
Wang He, Wang Hao and Lin Zhiqing, "Improving Classification Efficiency of Orthogonal Defect Classification Via a Bayesian Network Approach", 2009 Computational Intelligence and Software Engineering, CiSE 2009, 2009.
Hao Tang and Shi Liu, "Basic Theory of Fuzzy Bayesian Networks and Its Application in Machinery Fault Diagnosis", Fourth International Conference on Fuzzy Systems and Knowledge Discovery, FSKD 2007, 2007, 4:132-137.
DAhmet Okutan and Olcay Taner Yildiz, "Software defect prediction using Bayesian networks", Empirical Software Engineering, 19(1), February 2014.
Unchalisa Taetragool and Tiranee Achalakul, "Method for failure pattern analysis in disk drive manufacturing", International Journal of Computer Integrated Manufacturing, 24(9), September 2011.
Yingxia Cui, Longshu Li and Sheng Yao, "A New Strategy for Pair wise Test Case Generation", 3rd International symposium on Intelligent Information Technology Application, IITA 2009, 2009, 3:303-306.
Sanjai Rayadurgam and Mats P.E. Heimdahl, "Coverage Based Test-Case Generation using Model Checkers", Proceedings Eighth Annual IEEE International Conference & Workshop On the Engineering of Computer-Based System s-ECBS 2001; 2001, p83-91, 9p.
Katsuya Iwata, "Black-box test case generation from TFM module interface specifications and usage statistics", Iowa State University, 2012-01-01T08:00:00Z.
Hyojoung Shin, Don-Jung Choi, Bo-Keong Kim, Taebok Yoon and Jee-Hyong Lee, "A Wear-leveling Scheme for NAND Flash Memory based on Update Patterns of Data", Journal of the Korean Institute of Intelligent Systems, 20(6), December 2010, 761-767