Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution

Singh, Sukhdev; Tripathi, Yogesh Mani; Jun, Chi-Hyuck

doi:10.7232/iems.2015.14.2.183

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Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution

Journal title : Industrial Engineering and Management Systems
Volume 14, Issue 2, 2015, pp.183-195
Publisher : Korean Institute of Industrial Engineers
DOI : 10.7232/iems.2015.14.2.183

Title & Authors

Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution
Singh, Sukhdev; Tripathi, Yogesh Mani; Jun, Chi-Hyuck;

Abstract

In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer's risk and producer's risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.

Keywords

Consumer's Risk;Double Acceptance Sampling Plan;Group Acceptance Sampling Plan;Producer's Risk;Single Acceptance Sampling Plan;Truncated Life Test;Two-Stage Group Acceptance Sampling Plan;

Language

English

Cited by

1time(s) in CrossRef

Designing of multiple deferred state sampling plan for generalized inverted exponential distribution, Sequential Analysis, 2017, 36, 1, 76

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