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Structural damaging in few -layer graphene due to the low energy electron irradiation
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  • Journal title : Advances in nano research
  • Volume 4, Issue 1,  2016, pp.45-50
  • Publisher : Techno-Press
  • DOI : 10.12989/anr.2016.4.1.045
 Title & Authors
Structural damaging in few -layer graphene due to the low energy electron irradiation
Guseinov, Nazim R.; Baigarinova, Gulzhan A.; Ilyin, Arkady M.;
 Abstract
Data of Raman spectroscopy from graphene and few-layer graphene (FLG) irradiated by SEM electron beam in the range of energies 0.2 -30 keV are presented. The obvious effect of damaging the nanostructures by all used beam energies for specimens placed on insulator substrates () was revealed. At the same time, no signs of structural defects were observed in the cases when FLG have been arranged on metallic substrate. A new physical mechanism of under threshold energy defect production supposing possible formation of intensive electrical charged puddles on insulator substrate surface is suggested.
 Keywords
few-layer graphene;radiation effects;electric charged puddles;
 Language
English
 Cited by
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