A Dielectric Measurement Technique of Thin Samples at Microwave Frequencies

마이크로파에서 얇은 유전체의 유전상수 및 유전손실의 측정방법에 대한 연구

  • Published : 1988.12.01


A cavity perturbation technique is employed to determine the dielectric property of thin samples. Substrates in microwave integrated circuits are fabricated in sheet form and are expected to have a dielectric constant less than 10 and a dielectric loss better than 10**-3. This research aimed to determine both dielectric constant and dielectric loss with good accuracy. The tecynique makes use of thin circular disk samples placed in a right circular cylindrical cavity. The accuracy of measurements is within \ulcorner% for dielectric constnat and 3x10**-4 for dielectric loss.