Surface Analysis of Modified Polymer Samples by X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy

X-선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석

  • Park, Sung-Woo (Division of Chemical Analysis, The National Institute of Scientific Investigation) ;
  • Kim, Dong-Hwan (Division of Chemical Analysis, The National Institute of Scientific Investigation) ;
  • Kim, Young-Man (Advanced Analysis Center, Korea Institute of Science and Technology) ;
  • Park, Byung-Sun (Electronics and Telecommunications Research Institute) ;
  • Han, Wan-Soo (Department of Chemistry, Mokwon University) ;
  • Suh, Bae-Suk (Department of Chemistry, Catholic University Medical College)
  • 박성우 (국립과학수사연구소 화학분석과) ;
  • 김동환 (국립과학수사연구소 화학분석과) ;
  • 김영만 (한국과학기술연구원 특성분석센터) ;
  • 박병선 (전자통신연구소) ;
  • 한완수 (목원대학교 화학과) ;
  • 서배석 (카톨릭대학 화학과)
  • Received : 1994.07.18
  • Published : 1994.09.25

Abstract

X-Ray Photoelectron Spectroscopy(XPS) and Rutherford Backscattering Spectroscopy(RBS) are used for the analysis of additives, examination of chemical structure and determination of identity with qualitative and quantitative analysis of surface elements, binding energy level and depth profiling in the surface. We analyzed surface of polyethylene, acrylonitrile butadien rubber, polypropylene, glass, fiber and paper treated with $XeF_2$ or C-F plasma by XPS and RBS. It was found that fluoro element was penetrated to sample surface and the distribution of surface elements are different than untreated samples.