Screening bonding wire and the wideband characterization to reduce crosstalk between high density bonding wires

고밀도 본딩와이어간의 혼신감소를 위한 차폐 본딩왕이어 및 광대역 해석

  • 이상동 (아주대학교 전기전자공학부) ;
  • 이해영 (아주대학교 전기전자공학부)
  • Published : 1996.07.01


parallel bonding wires separaated with a screeing bonding wire are proposed and characterized in order to redue mutual coupling and parasitics of high-speed and high-density device packaging. The mehtod of moments (MoM) with the incorporation of the ohmic loss has been used in a wide range of frequencies. From the calculated results, we have found that the screening bonding wire effectively reduces inductive and capacitive crostalk levels more than 3dB. the parasitic self inductance is also reduced more than 12% by the screening effect. Therefore, for a general VLSi package, the packaging density can be increased more than 30% using the screening bonding wire. This screeing bonding wire and the analysis can be effectively used to reduce crosstalk and increase packaging density of high density devices.