DOI QR코드

DOI QR Code

A Study on Detecting Flaws Using DC Potential Drop Method

직류전위차법을 이용한 결함검출에 관한 연구

Bae, Bong-Guk;Seok, Chang-Seong
배봉국;석창성

  • Published : 2000.04.01

Abstract

In this paper, a DC potential drop measurement system was used to find the position of the flaw on a simple thin plate. Four-point probe test was evaluated and used for this study. In the four-point probe test, the more distance between current pins provides the more measurable scope, the less voltage difference, and the more voltage difference rate. In the other hand, the more distance between voltage pins provides the less voltage difference and the less voltage difference rate. An optimized four-point probe was applied to measure the relation between voltage and the relative position of flaw to the probe. The Maxwell 21) simulator was used to analyze the electromagnetic field, and it showed that the analytical result was similar to the experimental result within 11.4% maximum error.

Keywords

DCPD;Four-Point Probe;Voltage Difference;Flaw;Contact Resistance

References

  1. Marsh, K. J., Smeth, R. A. and Ritchie, R. O., 1992, 'Fatigue Crack Measurement Techniques and Applications,' Engineering Materials Advisory Service Ltd., pp.11-37
  2. ASTM E647, 1995, 'Guidelines for Electric Potential Difference Determination of Crack Size,' pp. 594-599
  3. Hartman G. A. and Johnson D. A., 1987, 'D-C Electric-Potential Method Applied to Thermal/Mechanical Fatigue Crack Growth,' Experimental Mechanics, pp, 106-112 https://doi.org/10.1007/BF02318872
  4. Valerio Bicego, Dino Liviero, Carlo Fossati, and Enrico Lucon, E., 1990, 'J-R Curve Testing Utilizing the Reversing Direct Current Electrical Potential Drop Method,' Applications of Automation Technology to Fatigue and Fracture Testing, ASTM STP 1092, A. A. Braun, N. E. Ashbaugh, and F. M. Smith, Eds., American Society for Testing and Materials, Philadelphia, pp. 143-166
  5. Wilkowski, G. M., Wambaugh, J. O., and Prabhat, K., 1984, 'Single-Specimen J-Resistance Curve Evaluations Using the Direct-Current Electric Potential Method and a Computerized Data Acquistion System,' Fracture Mechanics: Fifteenth Symposium, ASTM STP 833, R. J. Sanford, Ed., American Society for Testing and Materials, Philadelphia, pp. 553-576
  6. Costanza, V. and Mohaupt, U. H., 1990, 'A Local Field Potential Drop Crack Measurement System for Sizing and Characterizing Cracks,' Canadian Fracture Conference 21, pp.351-357
  7. ASTM F84-93, 1993, 'Standard Test Method for Measuring Resistivity of Silicon Wafers with an In-Line Four-Point Probe,' pp. 135-147
  8. ASTM B193-87, 1992, 'Standard Test Method for Resistivity of Electrical Conductor Materials,' pp. 308-311
  9. Nahm S. H., Kim A., Yu K. M., Suh C. M. and Park J. S., 1996, 'Evaluation of Toughness Degradation of Cr-Mo-V Steel Using Electric Resistivity,' KSME, Fall, pp. 292-297