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Properties of Te Fine Particle Doped SiO2 Gel by the Sol-Gel Method

졸-겔법에 의한 Te 미립자분산 SiO2 겔의 특성

  • 문종수 (경남대학교 신소재공학부) ;
  • 조범래 (계명대학교 재료공학과) ;
  • 강봉상 (경남대학교 신소재공학부)
  • Published : 2002.08.01

Abstract

$SiO_2$ gels containing dispersed fine Te metal particles have been prepared by the sol- gel method using a starting solution containing Tetraethoxy Silane (Si($OC_2$ $H_{5}$ )$_4$), $H_2$O, Ethylalchol ($C_2$$H_{5}$OH), Nitric Acid ($HNO_3$) and Tellurium Tetracholoride ($TeCl_4$) in a several molar ratio. Gelling time of sols was about 3 days and viscosity of solution was very low about 2~3 cP for 3 days. Heat-treatments of the gel have been performed at 500, 700, 900, 1100 and $1300^{\circ}C$ for 1 hour, respectively. We have investigated TG-DTA, X-ray diffraction patterns and SEM of heat-treatmented gels. The size of Te fine particles dispersed in $SiO_2$ gel was about 0.8~1 $\mu\textrm{m}$ and the shape was almost quadrangle.

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