Korean Journal of Materials Research (한국재료학회지)
- Volume 12 Issue 8
- /
- Pages.661-668
- /
- 2002
- /
- 1225-0562(pISSN)
- /
- 2287-7258(eISSN)
DOI QR Code
Properties of Ag Thin Films Deposited in Oxygen Atmosphere Using in- line Magnetron Sputter System
In-line 마그네트론 스퍼터 장치를 사용하여 산소 분위기에서 제작한 Ag 박막의 특성
- Ku, Dae-Young ;
-
Kim, Won-Mok
;
- Cho, Sang-Moo ;
- Hwang, Man-Soo ;
- Lee, In-Kyu ;
-
Cheong, Byung-Ki
;
-
Lee, Taek-Sung
;
-
Lee, Kyeong-Seok
;
- Cho, Sung-Hun
- 구대영 (한국항공대학교 항공재료공학과) ;
-
김원목
(한국과학기술연구원 재료연구부) ;
- 조상무 (아이티엠(주)) ;
- 황만수 (아이티엠(주)) ;
- 이인규 (한국항공대학교 항공재료공학과) ;
-
정병기
(한국과학기술연구원 재료연구부) ;
-
이택성
(한국과학기술연구원 재료연구부) ;
-
이경석
(한국과학기술연구원 재료연구부) ;
- 조성훈 (아주대학교 분자과학기술과)
- Published : 2002.08.01
Abstract
A study was made to examine the electrical, compositional, structural and morphological properties of Ag thin films deposited by DC magnetron sputtering in
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References
- T. Minami, MRS Bulletin, 38, Aug. (2000)
- T. Minami, H. Sato, H. Nanto, and S. Takata, Jpn. J. Appl. Phys. Part 2: Lett., 25, L776 (1986) https://doi.org/10.1143/JJAP.25.L776
- J. Hu, and R.G. Gordon, Sol. Cells, 30, 437 (1991) https://doi.org/10.1016/0379-6787(91)90076-2
- M. Bender, W. Seeling, C. Daube, H. Frankenberger, B. Ockor, and J. Stollenwerk, Thin Solid Films, 326, 67 (1998) https://doi.org/10.1016/S0040-6090(98)00520-3
- A. KI ppel, B. Meyer, and J. Trube, Thin Solid Films, 392, 311 (2001) https://doi.org/10.1016/S0040-6090(01)01049-5
- C. Charton, M. Fahland, Surfaces & Coatings Tech., 142, 175 (2001) https://doi.org/10.1016/S0257-8972(01)01148-3
- M. Scalora, M.J. Bloomer, A.S. Pethel, J.P. Dowling, C.M. Brown, and A.S. Manka, J. Appl. Phys., 83(5), 2377 (1998) https://doi.org/10.1063/1.366996
- M.J. Bloomer and M. Scalora, Appl. Phys. Lett., 72(14), 1676 (1998) https://doi.org/10.1063/1.121150
- E. Ando, M. Miyazaki, Thin Solid Films, 351, 308 (1999) https://doi.org/10.1016/S0040-6090(98)01796-9
- E. Ando, S. Suzuki, N. Aomine, M. Miyazaki, and M. Tada, Vacuum, 59, 792 (2000) https://doi.org/10.1016/S0042-207X(00)00349-3
- E. Ando, M. Miyazaki, Thin Solid Films, 392, 289 (2001) https://doi.org/10.1016/S0040-6090(01)01045-8
- Y. Xiong, H. Wu, Y. Guo, Y. Sun, D. Yang, and D. Da, Thin Solid Films, 375, 300 (2000) https://doi.org/10.1016/S0040-6090(00)01253-0
- CRC handbook of Chemistry and Physics, 61st Ed., CRC Press Inc., Boca Raton,Fl., USA, 1980, p.B-145
- L. Men, J. Tominaga, H. Fuji, and N. Atoda, Jpn. J. Appl. Phys., 39(5A), 2639 (2000) https://doi.org/10.1143/JJAP.39.2639
- L.H. Schwartz, and J.B. Cohen, Diffraction from Materials, 2nd Ed., p224, Springer-Verlag, Berlin, (1987)
- J.S. Ozcomert, W.W. Pai, N.C. Bartelt, and J.E. Reutt Robery, Phys. Rev. Lett, 72, 258 (1994) https://doi.org/10.1103/PhysRevLett.72.258
- A.R. Layson, and P.A. Thiel, Surf. Sci., 472, L151 (2001) https://doi.org/10.1016/S0039-6028(00)00968-7
- G.T. Duys and T. Farrel, Electrical Resistivity Handbook, p.535, Perter Peregrinus Ltd., London, UK, (1992)
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