New Challenges for Low Cost and High Speed RF ATE System

새로운 저가형 고속 RF 자동화 테스트 시스템

  • Song, Ki-Jae (RF System Lab., ASE Korea, Inc., Department of Radio Science and Engineering, Kwangwoon University) ;
  • Lee, Ki-Soo (RF System Lab., ASE Korea, Inc.) ;
  • Park, Jongsoo (RF System Lab., ASE Korea, Inc.) ;
  • Lee, Jong-Chul (Department of Radio Science and Engineering, Kwangwoon University)
  • Published : 2004.08.01

Abstract

This paper presents the implementation of the low cost and high speed RF ATE(Automatic Test Equipment) system, which can be a reasonable solution for reducing the test cost of RF devices. This paper suggests high speed and precise measurement capabilities which are realized by the 16 independent RF ports with high speed switching time and high accuracy digitizer using the industry standard Versus module eXtensions for Instrument(VXI) General Purpose Interface Bus(GPIB) interfaces. Also, the system has the capabilities of quad-site test which can dramatically increase the device throughput. This paper concludes with the demonstration of the implemented ATE system through the setup of RF Power Amplifier Module(PAM), which is under the most competitive market situation.

Keywords

ATE;Test;Receiver;PAM;VXI

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