Low Power Scan Test Methodology Using Hybrid Adaptive Compression Algorithm

하이브리드 적응적 부호화 알고리즘을 이용한 저전력 스캔 테스트 방식

  • 김윤홍 (상명대학교 컴퓨터시스템공학과) ;
  • 정준모 (군산대학교 전자정보공학부)
  • Published : 2005.08.01

Abstract

This paper presents a new test data compression and low power scan test method that can reduce test time and power consumption. A proposed method can reduce the scan-in power and test data volume using a modified scan cell reordering algorithm and hybrid adaptive encoding method. Hybrid test data compression method uses adaptively the Golomb codes and run-length codes according to length of runs in test data, which can reduce efficiently the test data volume compare to previous method. We apply a scan cell reordering technique to minimize the column hamming distance in scan vectors, which can reduce the scan-in power consumption and test data. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases. The proposed method showed an about a 17%-26% better compression ratio, 8%-22% better average power consumption and 13%-60% better peak power consumption than that of previous method.

Keywords

Low Power;Scan Test;Test Data Compression