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Design and Construction of a High Temperature Creep Tester for Thin Film Specimens

박막시험편용 고온 크리프 시험기의 설계 및 제작

  • 고경득 (전남대학교 대학원 기계공학과) ;
  • 이상신 ((주)POSCO 광양제철소) ;
  • 강기주 (전남대학교 기계시스템 공학부)
  • Published : 2007.02.01

Abstract

A new material tester has been developed to measure mechanical properties of thin film specimens at high temperature. It is useful for observing oxide film growth or local deformation on the surface, and for measuring creep strength. Main characteristics of the tester is as follows; First, high temperature is achieved by Joule heating generated by electricity passing through the specimen, which does not need to enclose the specimen by a furnace or a heating chamber. The exposed specimen enables one to observe the surface during the test. Because the overall size of the test rig is compact, the whole test rig can be placed in a chamber for environmental controlled tests. The loading device is from a level scales. Not only static load with fixed counter weight, but also variable load by moving counter weight controlled remotely can be applied for an ordinary creep test and creep-fatigue test, respectively. The detail of the construction, operation principle, and the specification are described. And also, an example of test result obtained using the creep tester is presented.

Keywords

Thin Film;Joule Heating;Infrared Rays Thermometer;Emissivity;Laser Reflection Interferometer

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