Analysis of Frequency Selective Surface on Isotropic/Anisotropic Layers Using WCIP Method

  • Titaouine, Mohammed (Institute d'Electronique, Centre Universitaire de Bordj Bou) ;
  • Gomes, Alfredo Neto (Telecommunication and Electromagnetisme Group, Federal Education Technological Center of Paraiba) ;
  • Baudrand, Henry (Ecole Superieure d'Electronique Electrotechnique Informatique, ENSEEIHT) ;
  • Djahli, Farid (Electronics Institute, University of Setif)
  • Received : 2006.05.04
  • Published : 2007.02.28

Abstract

The wave concept iterative procedure (WCIP) is used to analyze arbitrarily shaped frequency selective surfaces (FSS). The WCIP method is developed from the fast modal transform based on a two-dimensional fast Fourier transform algorithm. Using the proposed procedure, less computing time and memory are needed to calculate the scattering parameters of the FSS structure. The method is applied to the modeling of an FSS structure of a rectangular patch and a comparison with experimental results confirms good agreement.