Electrical Properties of SrRuO3 Thin Films with Varying c-axis Lattice Constant

  • Chang, Young-J. (ReCOE & FPRD, Department of Physics and Astronomy, Seoul National University) ;
  • Kim, Jin-I (Department of Physics, Hankuk University of Foreign Studies) ;
  • Jung, C.U. (Department of Physics, Hankuk University of Foreign Studies)
  • Published : 2008.06.30


We studied the effect of the variation of the lattice constant on the electrical properties of $SrRuO_3$ thin films. In order to obtain films with different volumes, we varied the substrate temperature and oxygen pressure during the growth of the films on $SrTiO_3$ (001) substrates. The films were grown using a pulsed laser deposition method. The X-ray diffraction patterns of the grown films at low temperature and low oxygen pressure indicated the elongation of the c-axis lattice constant compared to that of the films grown at a higher temperature and higher oxygen pressure. The in-plane strain states are maintained for all of the films, implying the expansion of the unit-cell volume by the oxygen vacancies. The variation of the electrical resistance reflects the temperature dependence of the resistivity of the metal, with a ferromagnetic transition temperature inferred form the cusp of the curve being observed in the range from 110 K to 150 K. As the c-axis lattice constant decreases, the transition temperature linearly increases.


  1. Y. Z. Yoo, O. Chmaissem, S. Kolesnik, B. Dabrowski, M. Maxwell, C. W. Kimball, L. McAnelly, M. Haji-Sheikh, and A. P. Genis, J. Appl. Phys. 97, 103525 (2005)
  2. Y. S. Kim, D. J. Kim, T. H. Kim, T. W. Noh, J. S. Choi, B. H. Park, and J.-G. Yoon, Appl. Phys. Lett. 91, 042908 (2007)
  3. I. I. Mazin and D. J. Singh, Phys. Rev. B 56, 2556 (1997)
  4. O. Auciello, C. M. Foster, and R. Ramesh, Annu. Rev. Mater. Sci. 28, 501 (1998)
  5. D. C. Worledge and T. H. Geballe, Phys. Rev. Lett. 85, 5182 (2000)
  6. G. Cao, S. McCall, M. Shepard, J. E. Crow, and R. P. Guertin, Phys. Rev. B 56, 321 (1997)
  7. Hyo-Jin Kim, Hyoun-Soo Kim, Do-Jin Kim, Young-Eon Ihm, Woong-Kil Choo, and Chan-Yong Hwang, J. Magnetics 12(4), 144 (2007)
  8. Jae-wan Chang, Hyun M. Jang, and Sang-Koog Kim, J. Magnetics 11(3), 108 (2006)
  9. K. W. Kim, J. S. Lee, T. W. Noh, S. R. Lee, and K. Char, Phys. Rev. B 71, 125104 (2005)
  10. K. S. Takahashi, A. Sawa, Y. Ishii, H. Akoh, M. Kawasaki, and Y. Tokura, Phys. Rev. B 67, 94413 (2003)
  11. B. Dabrowski, O. Chmaissem, P. W. Klamut, S. Kolesnik, M. Maxwell, J. Mais, Y. Ito, B. D. Armstron, J. D. Jorgensen, and S. Short, Phys. Rev. B 70, 014423 (2004)
  12. Dong-Hyeok Choi, In-Bo Shim, Tae-Joon Kouh, and Chul-Sung Kim, J. Magnetics 12(4), 141 (2007)
  13. Y. S. Kim, D. H. Kim, J. D. Kim, Y. J. Chang, T. W. Noh, J. H. Hong, K. Char, Y. D. Park, S. D. Bu, J.-G. Yoon, and J. S. Jung, Appl. Phys. Lett. 86, 102907 (2005)

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