DOI QR코드

DOI QR Code

Variation in the Magneto-Impedance (MI) Effect According to the Shape of Patterned Co30Fe34Ni36 Alloys

  • Kim, Hyun-Kyung (Division of Materials Science & Engineering, Korea Institute of Science and Technology (KIST)) ;
  • Kim, Do-Hun (Division of Materials Science & Engineering, Korea Institute of Science and Technology (KIST)) ;
  • Son, De-Rac (Applied Optics and Electromagnetics, Hannam University) ;
  • Jeung, Won-Young (Division of Materials Science & Engineering, Korea Institute of Science and Technology (KIST))
  • Published : 2008.06.30

Abstract

The magneto impedance (MI) behaviors of patterned $Co_{30}Fe_{34}Ni_{36}$ microwire were investigated with respect to its shape variation. After preparing $Co_{30}Fe_{34}Ni_{36}$ microwires using electrodeposition and photolithography methods, impedance measurements were conducted to compare the MI ratios of the devices with different aspect ratios. As a result, the anisotropy field and transverse permeability were found to be strongly affected by the aspect ratio of the device. The external field value at the maximum impedance and maximum sensitivity of the device was found to increase with increasing device width, which was attributed to the increased transverse anisotropy with decreasing aspect ratio. While an increase in the thickness also contributed to an increase in the MI ratio, a variation in the thickness not only increased the anisotropic field, but the variation in the MI ratio was as also affected by the skin effect. Conversely, the MI ratios of the present devices were hardly affected by variations in the length. Considering the typical aspect ratios of our devices, it was expected that the length effect would emerge when the aspect ratio was reduced to less than 10. Nevertheless, our results show that for the practical application of MI devices, the MI characteristics can be optimized by tailoring the aspect ratio of the devices.

Keywords

magneto impedance (MI);anisotropy field;skin effect;permeability

References

  1. K. Mohri, K. Kawashima, T. Kohzawa, and Y. Yoshida, IEEE Trans. Magn. 29, 1245 (1993) https://doi.org/10.1109/20.250629
  2. C. Dong, S. Chen, and T. Y. Hsu, J. Magn. Magn. Mater. 250, 288 (2002) https://doi.org/10.1016/S0304-8853(02)00410-9
  3. S. H. Park, D. W. Chun, J. H. Han, Y. H. Kim, and W. Y. Jeung, Phys. Stat. Sol. (a). 204, 4071 (2002) https://doi.org/10.1002/pssa.200777283
  4. H. B. Lee, Y. S. Kim, and S. C. Yu, J. Magnetics 7(4), 160 (2002) https://doi.org/10.4283/JMAG.2002.7.4.160
  5. A. T. Le, N. D. Ha, C. O. Kim, J. R. Rhee, N. Chau, N. Q. Hoa, N. D. Tho, and H. B. Lee, J. Magnetics 11(1), 55 (2006) https://doi.org/10.4283/JMAG.2006.11.1.055
  6. J. O. Lee, H. K. Kim, G. H. Kim, and W. Y. Jeung, J. Appl. Phys. 99, 08B704 (2006)
  7. G. V. Kurlyandkaya, J. M. Barandiaran, M. Vaquez, D. Garcia, and N. V. Dmitrieva, J. Magn. Magn. Mater. 740, 215-216 (2000)
  8. P. Jantaratana and C. Sirisathitkul, IEEE Trans. Magn. 42, 358 (2006) https://doi.org/10.1109/TMAG.2005.863270
  9. C. Garcia, J. Gonzalez, A. Chizhik, A. Zhukov, and J. M. Blanco, J. Appl. Phys. 95, 6756 (2004) https://doi.org/10.1063/1.1651811
  10. H. B. Nie, A. B. Pakhomov, X. Yan, X. X. Zhang, and M. Knobel, Sol. Stat. Commun. 112, 285 (1999) https://doi.org/10.1016/S0038-1098(99)00350-6
  11. H. Chiriac, T. A. Ovari, and C. S. Marinescu, J. Appl. Phys. 83, 6584 (1998) https://doi.org/10.1063/1.367926
  12. D. de Cos, A. Garcia-Arribas, and J. M. Barandiaran, IEEE Trans. Magn. 41, 3649 (2005) https://doi.org/10.1109/TMAG.2005.858474
  13. D. H. Kim, H. K. Kim, S. H. Park, and W. Y. Jeung, Submit to IEEE Trans. Magn.
  14. T. Mizoguchi and G. S. Cargill III, J. Appl. Phys. 50, 3570 (1579) https://doi.org/10.1063/1.326303
  15. V. Satya Narayana Murthy, S. Venkatesh, and G. Makandeyulu, J. Appl. Phys. 99, 08F108 (2006) https://doi.org/10.1063/1.2167352
  16. M. Vaquez, Y.-F. Li, and D.-X. Chen, J. Appl. Phys. 91, 6539 (2002) https://doi.org/10.1063/1.1469667
  17. W. Y. Jeung, H. K. Kim, and J. O. Lee, J. Kor. Mag. Soc., 15(4), 241 (2005) https://doi.org/10.4283/JKMS.2005.15.4.241
  18. W. Y. Jeung, H. K. Kim, and C. B. Park, J. Kor. Mag. Soc., 16(5), 249 (2006) https://doi.org/10.4283/JKMS.2006.16.5.249
  19. H. K Kim, D. W. Chun, J. H. Han, K. B. Kim, and W. Y. Jeung, Phys. Stat. Sol. (a). 204, 4104 (2007) https://doi.org/10.1002/pssa.200777201
  20. S. S. Yoon, C. G. Kim, J. Jang, and H. Lee, IEEE Trans. Magn. 36, 2872 (2000) https://doi.org/10.1109/20.908613