Thermally Stimulated Depolarization Current Test for Reliability of X5R MLCC

TSDC 방법을 이용한 X5R MLCC의 신뢰성 평가

  • Park, Ji-Young (MLCC R&D Group, LCR Division, Samsung Electro-Mechanics Co. Ltd.) ;
  • Park, Jae-Sung (MLCC R&D Group, LCR Division, Samsung Electro-Mechanics Co. Ltd.) ;
  • Kim, Young-Tae (MLCC R&D Group, LCR Division, Samsung Electro-Mechanics Co. Ltd.) ;
  • Hur, Kang-Heon (MLCC R&D Group, LCR Division, Samsung Electro-Mechanics Co. Ltd.)
  • 박지영 (삼성전기 LCR 사업부 LCR 재료개발팀) ;
  • 박재성 (삼성전기 LCR 사업부 LCR 재료개발팀) ;
  • 김영태 (삼성전기 LCR 사업부 LCR 재료개발팀) ;
  • 허강헌 (삼성전기 LCR 사업부 LCR 재료개발팀)
  • Published : 2009.03.31


The reliability could be one of the essential properties for multilayer ceramic capacitor (MLCC) using in various electronic devices and the concentration and mobility of oxygen vacancy would play important role in the reliability. To investigate the migration behavior of oxygen vacancies, thermally stimulated depolarization current (TSDC) is adopted. In dielectric material of X5R MLCC, the TSD-Current peak observed around 150$^{\circ}C$ and 200$^{\circ}C$ which represented the migration of oxygen vacancy. Substituting Yttrium for Dysprosium in X5R MLCC showed higher migration activation energy and lower TSD current density.


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