DOI QR코드

DOI QR Code

Current Limiting Characteristics of Improved Flux-Lock Type SFCL According to Winding Direction of Coil 2 and Variable Number of Coil 1 and Coil 2

개선된 자속구속형의 2차 측 권선 방향과 1차 권선수와 2차 권선수의 변화에 따른 사고전류제한 특성

  • Kim, Yong-Jin (Department of Electrical Engineering, Chonbuk National University) ;
  • Du, Ho-Ik (Advanced Graduate Education Center of Jeonbuk for Electronics and Information Technology-BK21, Chonbuk National University) ;
  • Lee, Dong-Hyeok (Department of Electrical Engineering, Chonbuk National University) ;
  • Han, Byoung-Sung (Department of Electrical Engineering, Chonbuk National University)
  • 김용진 (전북대학교 전기공학과) ;
  • 두호익 (전북대학교 전자정보고급인력양성사업단) ;
  • 이동혁 (전북대학교 전기공학과) ;
  • 한병성 (전북대학교 전기공학과)
  • Received : 2010.07.06
  • Accepted : 2010.08.20
  • Published : 2010.09.01

Abstract

The improved flux-lock type superconducting fault current limiter (SFCL) is composed of a series transformer and superconducting unit of the yttrium-barium-copper-oxide (YBCO) coated conductor. In this paper, we investigated current limiting characteristics through winding direction of coil 2 and variable number of coil 1 and coil 2 in improved flux-lock type SFCL. The better fault current characteristics and the burden of YBCO coated conductor can be confirmed from the experimental result in the higher turn ratio of coil 1 and coil 2 in the additive conditions. In case of subtractive condition, we can confirm a similar result in the same case of experimental conditions. but the burden of YBCO coated conductor has been increased from an increase in winding numbers of coil 2.

Keywords

SFCL;YBCO coated conductor;Inductance ratio;Winding direction

Acknowledgement

Supported by : 한국연구재단

References

  1. J. H. Kim and K. W. Lee, Journal of Electrical World, 256, 19 (1998).
  2. J. Sim, H. R. Kim, K. B. Park, J. S. Kang, B. W. Lee, I. S. Oh, and O. B. Hyun, Superconductivity and Cryogenics 6, 50 (2004).
  3. H.-S. Choi, N.-Y. Lee, Y.-H. Han, T.-H. Sung, and B.-S. Han, IEEE Trans. Appl. Supercond. 18, 737 (2008). https://doi.org/10.1109/TASC.2008.920637
  4. H.-I. Du, M.-J. Kim, S.-G. Doo, Y.-J. Kim, and B.-S. Han, Trans. Electr. Electron. Mater. 10, 62 (2009). https://doi.org/10.4313/TEEM.2009.10.2.062