The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications

전력전자용 금속증착 필름 커패시터 설계 및 신뢰성 평가

  • 윤중락 (삼화콘덴서공업(주) 연구소) ;
  • 김영광 (삼화콘덴서공업(주) 연구소) ;
  • 이석원 (호서대학교 시스템제어공학과) ;
  • 이헌용 (명지대학교 전기공학과)
  • Received : 2011.01.04
  • Accepted : 2011.03.17
  • Published : 2011.05.11


This paper presents the design and reliability evaluation of metallized film capacitor for power e lectronics application. The rated voltage of development capacitor is DC 3300[V], the capacitance is 5 ${\mu}F$ and the ripple current capability is 130 $A_{rms}$. Film metallization and patterns are an important design factor that has been development enhance the electric and reliability properties of film capacitor for power electronics. In term of capacitor construction and metallized pattern is one of the parameters that can be modified to further improve the rating in the terms of maximum ripple current and lifetime. This capacitor can be used as snubber capacitor application such as power train invertor system.


  1. J. Arai, K. Iba, T. Funabashi, Y. Nakanishi, K. Koyanagi, and R. Yokoyama, Circuits and Systems Magazine, IEEE, 8, 52 (2008).
  2. A. Emadi, Y. J. Lee, and Rajashekara, IEEE Trans. Ind. Electron. Engineering, 55, 2237 (2008).
  3. B. Y. Lee, I. K. Chong, W. Y. Lee, K. Y. Park, S. H. Lee, and Y. K. Kim, Trans. KIEE, 52, 203 (2003).
  4. D. Montanari, K. Saarinen, F. Scagliarini, D. Zeidler, M. Niskala, and C. Nender (CARTS Europe, 2008).
  5. J. G. Kim, D. J. Lee, I. J. Kim, and Y. J. Park, Trans. KIEE, 59, 1242 (2010).
  6. Y. Yoshida, M. Nishimatsu, IEEE Trns. Dielectr. Electy. Insul., 20 (1985).
  7. T. I. Propokowice and A. R. Vaskas, ECOM Report, No. 90705-F (1969).
  8. J. Zhao and F. Liu, Microelectron. Reliab., 47, 434 (2007).
  9. J. R. Yoon, K. M. Lee, and S. W. Lee, Trans. Electr. Electron. Mater., 10, 5 (2009).