Accelerated Life Testing and Validity Evaluation of Finger Strips Used for Electromagnetic Shielding Doors

전자파 차폐 도어용 핑거 스트립의 가속수명시험 및 유효성 평가

  • Lee, Joo Hong (Reliability Assessment Center, Korea Institute of Machinery & Materials) ;
  • Kim, Do Sik (Reliability Assessment Center, Korea Institute of Machinery & Materials) ;
  • Chang, Mu Seong (Reliability Assessment Center, Korea Institute of Machinery & Materials) ;
  • Cho, Hae Yong (Dept. of Mechanical Eng., Chungbuk Nat'l Univ.)
  • 이주홍 (한국기계연구원 신뢰성평가센터) ;
  • 김도식 (한국기계연구원 신뢰성평가센터) ;
  • 장무성 (한국기계연구원 신뢰성평가센터) ;
  • 조해용 (충북대학교 기계공학부)
  • Received : 2015.02.09
  • Accepted : 2015.07.16
  • Published : 2015.09.01


Many persons and electronic devices are exposed to electromagnetic (EM) waves generated from magnetic resonance imaging (MRI) equipment, EM pulses (EMPs), and many other kinds of EM wave devices. Finger strips are used to provide shielding from these EM waves. Because of the high thermal conductivity of finger strips, they are used in the design of specialized doors that are installed in shielded rooms. In this study, we perform an accelerated life test using the load acceleration stress, which affects the main failure mode of finger strips. We predict the life of the finger strip under normal usage conditions based on the results of the accelerated life test. We compare the results with those predicted from the life test under normal usage conditions to evaluate the validity of accelerated life testing.


Finger Strip;Accelerated Life Test;$B_{10}$ Life;Accelerated Factor;Shielding Door


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