DOI QR코드

DOI QR Code

High Quality AlN Layer Regrown on AlN Nanostructure by Hydride Vapor Phase Epitaxy

나노구조를 응용한 AlN 성장 방법 및 특성

Son, Hoki;Gim, Jinwon;Lim, Tea-Young;Lee, Mijai;Kim, Jin-Ho;Jeon, Dae-Woo;Hwang, Jonghee;Oh, Hae-Kon;Choi, YoungJun;Lee, Hae-Yong
손호기;김진원;임태영;이미재;김진호;전대우;황종희;오해곤;최영준;이혜용

  • Received : 2015.10.19
  • Accepted : 2015.10.24
  • Published : 2015.11.01

Abstract

In this paper, high quality AlN layers were regrown on AlN nanopillar structure with $SiO_2$-dots by HVPE. Surface morphology of AlN layer regrown exhibited flatter than a conventional AlN template. The laterally overgrown AlN regions would consist of a continuous well coalesced layer with lower dislocation density than in the template because of the dislocation blocking and dislocation bending effects. Moreover, result of Raman spectroscopy suggest that the AlN nanopillar structure with $SiO_2$-dots relieves the strain in the AlN layer regrown by HVPE.

Keywords

AlN;Nano structure;HVPE;Refractive index

References

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Acknowledgement

Supported by : 지식경제부