A Vehicle SoC Fault Diagnosis Technique using FlexRay Protocol

Kang, Seung-Yeop;Jung, Ji-Hun;Park, Sung-Ju

  • 투고 : 2014.11.15
  • 심사 : 2016.01.20
  • 발행 : 2016.01.30


In this paper, we propose vehicle SoC fault diagnosis platform using FlexRay protocol in order to detect the faults of semiconductor control chip even after vehicle production. Before FlexRay protocol by sending NFI (Null Frame Indicator) bit among the header segment and a specific identifier in the payload segment of FlexRay frame, this technique can be distinguishable from normal mode and test mode. By using this technique, it is possible to detect the faults such as performance degradation of vehicle network system caused by the aging or several problems of vehicle semiconductor chip. Also high reliability and safety of vehicle can be maintained by using structural test for vehicle SoC fault detection.


FlexRay Protocol;Null Frame Indicator;IEEE 1149.1;FPGA;BIST;Structural test


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연구 과제번호 : Development of system-level fault detection method and international standard to secure

연구 과제 주관 기관 : KEIT