Preparation and Luminescence of Europium-doped Yttrium Oxide Thin Films

  • Chung, Myun Hwa (Department of Advanced Materials Engineering Chungbuk National University) ;
  • Kim, Joo Han (Department of Advanced Materials Engineering Chungbuk National University)
  • Received : 2017.02.28
  • Accepted : 2017.03.27
  • Published : 2017.03.30


Thin films of europium-doped yttrium oxide ($Y_2O_3$:Eu) were prepared on Si (100) substrates by using a radio frequency (RF) magnetron sputtering. After the deposition, the films were annealed at $1000^{\circ}C$ in an air ambient for 1 hour. X-ray diffraction analysis revealed that the $Y_2O_3$:Eu films had a polycrystalline cubic ${\alpha}-Y_2O_3$ structure. The as-deposited films showed no photoluminescence (PL), which was due to poor crystalline quality of the films. The crystallinity of the $Y_2O_3$:Eu films was significantly improved by annealing. The strong red PL emission was observed from the annealed $Y_2O_3$:Eu films and the highest intensity peak was centered at around 613 nm. This emission peak originated from the $^5D_0{\rightarrow}^7F_2$ transition of the trivalent Eu ions occupying the $C_2$ sites in the cubic ${\alpha}-Y_2O_3$ lattice. The broad PL excitation band was observed at wavelengths below 280 nm, which was attributed to the charge transfer transition of the trivalent Eu ion.


Supported by : National Research Foundation (NRF), Chungbuk National University


  1. A. Fukabori, T. Yanagida, J. Pejchal, S. Maeo, Y. Yokota, A. Yoshikawa, T. Ikegami, F. Moretti, and K. Kamada, J. Appl. Phys. 107, 073501 (2010).
  2. G. D. Wilk, R. M. Wallace, and J. M. Anthony, J. Appl. Phys. 89, 5243 (2001).
  3. Y.-P. Fu, S.-B. Wen, and C.-S. Hsu, J. Alloys Comp. 458, 318 (2008).
  4. G. Chen, W. Qi, Y. Li, C. Yang, and X. Zhao, J. Mater. Sci.: Mater. Electron. 27, 5628 (2016).
  5. G. Blasse and B. C. Grabmaier, Luminescent Materials (SpringerVerlag, Berlin, Heidelberg, 1994).
  6. X. Wu, Y. Liang, R. Liu, and Y. Li, Mater. Res. Bull. 45, 594 (2010).
  7. L. Ma, X. Hu, S. Sun, J. Liu, J. Hu, and S. Yan, J. Electrochem. Soc. 156, P39 (2009).
  8. V. B. Taxak, S. P. Khatkar, S.-D. Han, R. Kumar, and M. Kumar, J. Alloys Comp. 469, 224 (2009).
  9. Y. Shimomura and N. Kijima, Electrochem. Solid-State Lett. 7, H1 (2004).
  10. Y. Nakanishi, A. Miyake, H. Kominami, T. Aoki, Y. Hatanaka, and G. Shimaoka, Appl. Surf. Sci. 142, 233 (1999).
  11. Joint Committee on Powder Diffraction Standards (JCPDS), Powder Diffraction Files, Inorganic, No. 43-1036.
  12. B. D. Cullity, Elements of X-ray Diffraction, 2nd ed. (AddisonWesley, Reading, MA, 1978).
  13. L. Liu, R. Li, Y. Deng, L. Li, S. Lan, W. Zi, and S. Gan, Appl. Surf. Sci. 307, 393 (2014).
  14. M. Buijs, A. Meyerink, and G. Blasse, J. Lumin. 37, 9 (1987).