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Journal of the Institute of Electronics and Information Engineers
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  • Schur Algorithm for Sub-bottom Profiling
  • Bae, Jinho ; Lee, Chong Hyun ; Kim, Hoeyong ; Cho, Jung-Hong ;
  • Journal of the Institute of Electronics and Information Engineers, volume 50, issue 9, 2013, Pages 156~163
  • DOI : 10.5573/ieek.2013.50.9.156
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  • Multi-scale Crack Detection Using Scaling
  • Kim, Young-Ro ; Oh, Tae-Myung ;
  • Journal of the Institute of Electronics and Information Engineers, volume 50, issue 9, 2013, Pages 194~200
  • DOI : 10.5573/ieek.2013.50.9.194
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  • The Reduction Method for Radiated EMI in USB Power Line of Cable
  • Park, Kyoung-Jin ; Lee, Dae-Woo ; Ko, Yong-Mok ; Gang, Eun-Gyun ; Park, Jong-Hyun ; Kim, Keun-Yong ; Ra, Keuk-Whan ;
  • Journal of the Institute of Electronics and Information Engineers, volume 50, issue 9, 2013, Pages 201~208
  • DOI : 10.5573/ieek.2013.50.9.201
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