In this paper, we introduce a new elliptic PDE:

where

is the admittivity distribution of the conducting material

and it is shown that the introduced elliptic PDE can replace the standard elliptic PDE with conductivity coefficient in EIT imaging. Indeed, letting

be the solution to the standard elliptic PDE with conductivity coefficient, the solution

is quite close to the solution

and can show spectroscopic properties of the conducting object

unlike

. In particular, the potential

can be used in detecting a thin low-conducting anomaly located in

since the spectroscopic change of the Neumann data of

is inversely proportional to thickness of the thin anomaly.