JOURNAL BROWSE
Search
Advanced SearchSearch Tips
 HOME > Journal Browse > About Journal > Journal Vol & Issue
Transactions on Electrical and Electronic Materials
Journal homepage(new window)
Journal Basic Information
pISSN :
1229-7607 
eISSN :
2092-7592 
Journal DOI :
10.4313/TEEM 
Frequency :
Others 
Editor in Chief :
move
Print(new window) E-mail(new window) Excel Download
1
  • Study of Thermal Stability of Ni Silicide using Ni-V Alloy
  • Zhong, Zhun ; Oh, Soon-Young ; Lee, Won-Jae ; Zhang, Ying-Ying ; Jung, Soon-Yen ; Li, Shi-Guang ; Lee, Ga-Won ; Wang, Jin-Suk ; Lee, Hi-Deok ; Kim, Yeong-Cheol ;
  • Transactions on Electrical and Electronic Materials, volume 9, issue 2, 2008, Pages 47~51
  • DOI : 10.4313/TEEM.2008.9.2.047
  • Abstract(view)
PDF Download(new window)
2
  • Abstract(view)
PDF Download(new window)
3
  • Abstract(view)
PDF Download(new window)
4
  • Abstract(view)
PDF Download(new window)
5
  • Abstract(view)
PDF Download(new window)
6
  • Abstract(view)
PDF Download(new window)
7
  • Abstract(view)
PDF Download(new window)
8
  • Abstract(view)
PDF Download(new window)