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Applied Science and Convergence Technology
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eISSN :
2288-6559 
Journal DOI :
10.5757/ASCT 
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  • Low Temperature Test of HWR Cryomodule
  • Kim, Heetae ; Kim, Youngkwon ; Lee, Min Ki ; Park, Gunn-Tae ; Kim, Wookang ;
  • Applied Science and Convergence Technology, volume 25, issue 3, 2016, Pages 47~50
  • DOI : 10.5757/ASCT.2016.25.3.47
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