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Journal of the Korean Institute of Electrical and Electronic Material Engineers
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  • Photoreflectance Characteristics of Interface
  • Lee, Jung-Yeul ; Kim, Dong-Lyeul ; Lee, Dong-Yul ; Yu, Jae-In ; Son, Jeong-Sik ; Bae, In-Ho ; Kim, Sang-Gi ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 12, issue 6, 1999, Pages 492~492
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  • Effect of Thin Films for -FET structure
  • Choi, Kyu-Jeong ; Shin, Woong-Chul ; Yang, Jung-Hwan ; Yoon, Soon-Gil ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 12, issue 6, 1999, Pages 517~517
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  • The characteristics of bilayer
  • Jeoung, Jin-Man ; Lee, Hyun-Yong ; Chung, Hong-Bay ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 12, issue 6, 1999, Pages 522~522
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