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Journal of the Korean Institute of Electrical and Electronic Material Engineers
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  • Wafer Burn-in Method for SRAM in Multi Chip Package
  • Yoon, Jee-Young ; Ryu, Jang-Woo ; Kim, Hoo-Sung ; Sung, Man-Young ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 18, issue 6, 2005, Pages 506~509
  • DOI : 10.4313/JKEM.2005.18.6.506
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  • A Study on the Within Wafer Non-uniformity of Oxide Film in CMP
  • Park, Ki-Hyun ; Jung, Jae-Woo ; Park, Boum-Young ; Seo, Heon-Deok ; Lee, Hyun-Seop ; Jeong, Hae-Do ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 18, issue 6, 2005, Pages 521~526
  • DOI : 10.4313/JKEM.2005.18.6.521
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  • Genomic Detection using Electrochemical Method
  • Choi, Yong-Sung ; Lee, Kyung-Sup ; Park, Dae-Hee ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 18, issue 6, 2005, Pages 560~570
  • DOI : 10.4313/JKEM.2005.18.6.560
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