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Journal of the Korean Institute of Electrical and Electronic Material Engineers
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  • Simulation Study of ion-implanted 4H-SiC p-n Diodes
  • Lee, Jae-Sang ; Bahng, Wook ; Kim, Sang-Cheol ; Kim, Nam-Kyun ; Koo, Sang-Mo ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 22, issue 2, 2009, Pages 128~131
  • DOI : 10.4313/JKEM.2009.22.2.128
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