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Journal of the Korean Institute of Electrical and Electronic Material Engineers
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  • Local Oxidation of 4H-SiC using an Atomic Force Microscopy
  • Jo, Yeong-Deuk ; Bahng, Wook ; Kim, Sang-Cheol ; Kim, Nam-Kyun ; Koo, Sang-Mo ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 22, issue 8, 2009, Pages 632~636
  • DOI : 10.4313/JKEM.2009.22.8.632
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  • Structural Properties of P(VDF-TrFE) LB Films
  • Kwak, Eun-Hwi ; Lee, Jin-Ho ; Jung, Chi-Sup ;
  • Journal of the Korean Institute of Electrical and Electronic Material Engineers, volume 22, issue 8, 2009, Pages 698~703
  • DOI : 10.4313/JKEM.2009.22.8.698
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