• Title, Summary, Keyword: ATE

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The Study on Improvement of ATE Reliability in Production Phase (무기체계 양산단계 자동화 시험장비(ATE) SW 신뢰성 향상 방안 연구)

  • Yoon, Young-Ho;Ku, Ki-Young;Keum, Jong-Joo;Hwang, Un-Hee;Woo, Soon
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.47 no.6
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    • pp.19-26
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    • 2010
  • Nowadays, the high technology weapons system has been developed and the importance of ATE which measures the test specification is growing bigger and bigger. So the ATE software reliability becomes critical but the regulation of ATE development/management is less inadequate than that of DoD. In this paper, the improvement way of the ATE software reliability verification and ATE development/management processes were proposed.

A Study on Automatic Test Equipment Validation in the Realm of Defense (국방 분야 자동화시험장비 유효성 확인 방안에 관한 연구)

  • Pak, Se-Jin
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.21 no.9
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    • pp.144-150
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    • 2020
  • This study examined the current status of ATE in the development stage of the domestic guided weapons field, including the re-establishment of automatic test equipment (ATE), and attempted to develop methods to verify the validity of ATE in the defense sector. This study includes methods for confirming the repeatability and reproducibility of newly manufactured or replaced ATE. An error injection test is required for validation in the development phase. And pre-inspection steps are required for validation. When developing ATE, the use of an international standard testing script language ensures efficient validation and SW reliability. This ensures interoperability between the main and test equipment, and the tester can secure a test system platform that supports standardized testing methods, which is considered to be effective in validating specific ATE for each weapon system.

Implementation of ATE to Maintain Pre-Amplifier of Thermal Imaging System (열상장비 전단증폭부 정비용 ATE의 구현)

  • Park, Jai-Hyo;Kim, Han-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.49 no.1
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    • pp.80-87
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    • 2012
  • We have developed the ATE(Automatic Test Equipment) system for the performance test of pre-amplifier of thermal imaging devices. The device regenerates the electronic signals of photon detection module which is normally in weak energy, for the image signals processing. Previous ATE system was primarily and actively developed in the field of semiconductor devices quality parts inspection. Recently, it has been studied in the field of performance testing of equipment. In the field of thermal performance test equipment, however, it lacks the study of ATE compared to other areas, which causes the maintenance related to the core of military thermal imaging system maintenance to be limited. In this paper, a new study of ATE in the field of thermal imaging system is done. It is designed to be used universally for the ATE system with different types of circuit card of thermal imaging system by adopting matrix relays. Using the developed ATE measuring the pre-amplifier amplitude, an average amplified amplitude of 2.71Vpp was measured which confirms that it is within the range of theoretical analysis and also verifies the good performance of the developed ATE.

Verification Methods of ATE for TICN System (전술정보통신체계 ATE 유효성 검증 방안)

  • Bak, HyeonJeong;Kim, JinSung
    • Journal of the Korea Industrial Information Systems Research
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    • v.25 no.4
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    • pp.17-27
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    • 2020
  • In this paper, we proposed verification methods to prove the effectiveness of automatic test equipment (ATE) for weapon systems. Since the test results from the unproven ATE is not reliable and its use is limited as objective data, it is essential to verify the test equipment in order to guarantee the quality level of the unit under test (UUT). Through the suggested methods, it is applied to the ATE of the tactical information communications network (TICN) system to confirm the verification results and to describe the validation results.

Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development

  • Sato, Masayuki;Wakamatsu, Hiroki;Arai, Masayuki;Ichino, Kenichi;Iwasaki, Kazuhiko;Asakawa, Takeshi
    • Journal of Information Processing Systems
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    • v.4 no.4
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    • pp.121-132
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    • 2008
  • VLSI chips have been tested using various automatic test equipment (ATE). Although each ATE has a similar structure, the language for ATE is proprietary and it is not easy to convert a test program for use among different ATE vendors. To address this difficulty we propose a tester structure expression language, a tester language with a novel format. The developed language is called the general tester language (GTL). Developing an interpreter for each tester, the GTL program can be directly applied to the ATE without conversion. It is also possible to select a cost-effective ATE from the test program, because the program expresses the required ATE resources, such as pin counts, measurement accuracy, and memory capacity. We describe the prototype environment for the GTL and the tester selection tool. The software size of the prototype is approximately 27,800 steps and 15 manmonths were required. Using the tester selection tool, the number of man-hours required in order to select an ATE could be reduced to 1/10. A GTL program was successfully executed on actual ATE.

Faster Ate Pairing Computation over Pairing-Friendly Ellipitic Curves Using GLV Decomposition

  • Eom, Soo Kyung;Lee, Eunjeong;Lee, Hyang-Sook
    • ETRI Journal
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    • v.35 no.5
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    • pp.880-888
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    • 2013
  • The preexisting pairings ate, $ate_i$, R-ate, and optimal-ate use q-expansion, where q is the size of the defining field for the elliptic curves. Elliptic curves with small embedding degrees only allow a few of these pairings. In such cases, efficiently computable endomorphisms can be used, as in [11] and [12]. They used the endomorphisms that have characteristic polynomials with very small coefficients, which led to some restrictions in finding various pairing-friendly curves. To construct more pairing-friendly curves, we consider ${\mu}$-expansion using the Gallant-Lambert-Vanstone (GLV) decomposition method, where ${\mu}$ is an arbitrary integer. We illustrate some pairing-friendly curves that provide more efficient pairing from the ${\mu}$-expansion than from the ate pairing. The proposed method can achieve timing results at least 20% faster than the ate pairing.

Maintainability Improvement of Automatic Test Equipment for Aircraft (비행체 자동점검장비의 유지보수성 향상 방안)

  • Seo, Min-gi;Kwon, Ki-yong;Kim, Seong-woo;Lee, Seong-woo
    • Journal of Advanced Navigation Technology
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    • v.21 no.5
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    • pp.508-513
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    • 2017
  • Maintainability in engineering terms means ease of maintenance / management of the product. Aircraft automatic test equipment (ATE) is heavily influenced by the design changes of the unit under test(UUT) since the test procedure is developed according to the function / performance characteristics of the UUT. Moreover, if the integrated ATE is an environment that checks more than one UUT, it is not easy to maintain the ATE for the UUT design changes. Developers should be able to flexibly cope with the change of development staff by selecting an easy and clear development method to improve the maintainability of ATE. It is also necessary to limit the area affected by the UUT design change to a specific range to minimize the area to be modified. In this paper, we propose ATE development method which focuses on maintenance improvement based on the aircraft ATE development process.

Ablation of Arg-tRNA-protein transferases results in defective neural tube development

  • Kim, Eunkyoung;Kim, Seonmu;Lee, Jung Hoon;Kwon, Yong Tae;Lee, Min Jae
    • BMB Reports
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    • v.49 no.8
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    • pp.443-448
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    • 2016
  • The arginylation branch of the N-end rule pathway is a ubiquitin-mediated proteolytic system in which post-translational conjugation of Arg by ATE1-encoded Arg-tRNA-protein transferase to N-terminal Asp, Glu, or oxidized Cys residues generates essential degradation signals. Here, we characterized the ATE1−/− mice and identified the essential role of N-terminal arginylation in neural tube development. ATE1-null mice showed severe intracerebral hemorrhages and cystic space near the neural tubes. Expression of ATE1 was prominent in the developing brain and spinal cord, and this pattern overlapped with the migration path of neural stem cells. The ATE1−/− brain showed defective G-protein signaling. Finally, we observed reduced mitosis in ATE1−/− neuroepithelium and a significantly higher nitric oxide concentration in the ATE1−/− brain. Our results strongly suggest that the crucial role of ATE1 in neural tube development is directly related to proper turn-over of the RGS4 protein, which participate in the oxygen-sensing mechanism in the cells.

Effects of Non-Alcoholic Fatty Liver in Rats by Acer tagmentosum Maxim. Extract (산겨릅나무 추출물을 이용한 비알콜성 지방간 개선 효과)

  • Seo, Yoonhee;Lee, Sang-Hwa;Hwang, Hyung Seo;Choe, Soo Young
    • The Korean Journal of Food And Nutrition
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    • v.29 no.3
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    • pp.307-312
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    • 2016
  • This study was performed to investigate the effects of Acer tegmentosum Maxim. extract (ATE) on non-alcoholic fatty liver in Sprague Dawley (SD) rats. During oral administration of ATE, non-alcoholic fatty liver was induced by treatment with DL-ethionine. The lipid, total cholesterol (T-CHO) and malondialdehyde (MDA) in the liver tissue of ATE-fed rats showed lower levels, as compared to ATE-unfed rats. In ATE-fed rats, the serum levels of alanine aminotransferase (ALT), aspartate aminotransferase (AST) and ${\gamma}$-glutamyl transferase (GGT) were lower than the case of ATE-unfed rats. Oil red staining of the liver showed that the lipid deposits were decreased by feeding ATE. These results strongly indicated that ATE has positive effects of protection against non-alcoholic fatty liver formation.

Implementation of Impedance Matching Circuit for ATE (고속 ATE 시스템을 위한 임피던스 정합회로 구현)

  • Kim, Jong-Won;Seo, Yong-Bae;Lee, Yong-Sung
    • Journal of the Semiconductor & Display Technology
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    • v.5 no.4
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    • pp.17-22
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    • 2006
  • In the manufacturing processes of semiconductor, test process is important for quality of products. In the manufacturing process of dynamic memory, memory test is more important. So, automatic test equipment(ATE) is used necessarily. But, according to increase of speed of dynamic memory operation, the rapid test equipment is needed. Impedance matching between ATE and dynamic memory is expected to be an important problem for making a rapid test equipment over 1Gbps. According to increase of speed, inner impedance of ATE also works on important parameter for test. This paper is about the method that is for impedance matching of inner impedance and coaxial cable occurring in manufacturing of ATE. We proved effects of inner impedance by electric theory and verified the method of impedance matching using computer simulation.

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