• Title, Summary, Keyword: Atomic Force Microscope

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Study on the Elastic Characteristics of Living Cells using Atomic Force Microscope Indentation Technique

  • Kwon Eun-Young;Kim Young-Tae;Kim Dae-Eun
    • KSTLE International Journal
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    • v.7 no.1
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    • pp.10-13
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    • 2006
  • In this work, imaging and study of elastic property of the living cell was performed. The motivation of this work was to seek the possibility of exploiting Young's modulus as a disease indicator using Atomic Force Microscope (AFM) and also to gain fundamental understanding of cell mechanics for applications in medical nanorobots of the future. L-929 fibroblast adherent cell was used as the sample. Imaging condition in cell culturing media environment was done in very low speed ($20{\mu}m/ s$) compared to that in the ambient environment. For measuring the Young's modulus of the living cell, AFM indentation method was used. From the force-distance curve obtained from the indentation experiment the Young's modulus could be derived using the Hertz model. The Young's modulus of living L-929 fibroblast cell was $1.29{\pm}0.2$ kPa.

Precision measurement of a laser micro-processing surface using a hybrid type of AFM/SCM (하이브리드형 AFM/SCM을 이용한 레이저 미세 가공 표면 측정)

  • Kim, Jong-Bae;Kim, Kyeong-Ho;Bae, Han-Sung;Nam, Gi-Jung;Lee, Dae-Chul;Seo, Woon-Hak
    • Proceedings of the Korean Society of Laser Processing Conference
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    • pp.123-127
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    • 2006
  • Hybrid type microscope with a Scanning Confocal Microscope (SCM) and a shear-force Atomic Force Microscope (AFM) is suggested and preliminarily studied. A image of $120{\times}120{\mu}m^2$ is obtained within 1 second by SCM because scan speed of a X-axis and Y-axis are 1kHz and 1Hz, respectively. Shear-force AFM is able to correctly measure the hight and width of sample with a resolution 8nm. However, the scan speed is slow and it is difficult to distinguish a surface composed of different kinds of materials. We have carried out the measurement of total image of a sample by SCM and an exact analysis of each image by shear-force AFM.

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A New Method for Lateral Force Calibration in Atomic Force Microscope (원자현미경(AFM)에서 마찰력 측정을 위한 새로운 보정 기술 연구)

  • Yoon Eui-Sung;Kim Hong Joon;Wang Fei;Kong Hosung
    • Tribology and Lubricants
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    • v.21 no.5
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    • pp.221-226
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    • 2005
  • A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.

Wear Characteristics of Atomic force Microscope Tip (Atomic Force Microscope Tip 의 마멸특성에 관한 연구)

  • 정구현;김대은
    • Journal of the Korean Society for Precision Engineering
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    • v.20 no.5
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    • pp.189-195
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    • 2003
  • Atomic Force Microscope (AFM) has been widely used in micro/nano-scale studies and applications for. the last few decade. In this work, wear characteristics of silicon-based AFM tip was investigated. AFM tip shape was observed using a high resolution SEM and the wear coefficient was approximately calculated based on Archard's wear equation. It was shown that the wear coefficient of silicon and silicon nitride were in the range of ${10}^{-1}$~${10}^{-3}$ and ${10}^{-3}$~${10}^{-4}$, respectively. Also, the effect of relative humidity and sliding distance on adhesion-induced tip wear was discussed. It was found that the tip wear has more severe for harder test materials. Finally, the probable wear mechanism was analyzed from the adhesive and abrasive interaction point of view.

Nanoscale Processing on Silicon by Tribochemical Reaction

  • Kim, J.;Miyake, S.;Suzuki, K.
    • Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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    • pp.67-68
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    • 2002
  • The properties and mechanism of silicon protuberance and groove processing by diamond tip sliding using atomic force microscope (AFM) in atmosphere were studied. To control the height of protuberance and the depth of groove, the processed height and depth depended on load and diamond tip radius were evaluated. Nanoprotuberances and grooves were fabricated on a silicon surface by approximately 100-nm-radius diamond tip sliding using an atomic force microscope in atmosphere. To clarify the mechanical and chemical properties of these parts processed, changes in the protuberance and groove profiles due to additional diamond tip sliding and potassium hydroxide (KOH) solution etching were evaluated. Processed protuberances were negligibly removed, and processed grooves were easily removed by additional diamond tip sliding. The KOH solution selectively etched the unprocessed silicon area. while the protuberances, grooves and flat surfaces processed by diamond tip sliding were negligibly etched. Three-dimensional nanofabrication is performed in this study by utilizing these mechanic-chemically processed parts as protective etching mask for KOH solution etching.

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Analysis of Dynamic Behavior of Piezoelectric Atomic Force Microscope Cantilever (압전형 AFM 외팔보의 동적거동 해석)

  • 하성규;박성균;김영호
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.12 no.3
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    • pp.187-194
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    • 2002
  • A seven-port impedance and admittance matrices of multilayered piezoelectric beam are derived for the analysis of piezoelectric AFM ( atomic force microscope) cantilever that is partially covered by the piezoelectric layer. The variational principle is used for deriving the extensional and flexural motional equations and the conjugate parameters. Overall impedance matrix of AFM cantilever can be obtained by combining two impedance matrices of the covered and the non-covered. she resonance and antiresonance frequencies and the effective electromechanical coupling factors are calculated using the derived matrices. The results and the three dimensional finite element solutions are compared with the experimental results in other publication.

Molecular Dynamics Simulations of Fullerene Nanostructure Fabrications by Atomic Force Microscope Carbon Nanotube tip (원자간력 현미경 탄소 나노튜브 팁을 이용한 플러렌 나노 구조물 제작에 관한 분자동역학 시뮬레이션)

  • 이준하;이홍주
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.8
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    • pp.812-822
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    • 2004
  • This paper shows that carbon nanotubes can be applied to a nanopipette. Nano space in atomic force microscope multi-wall carbon nanotube tips is filled with molecules and atoms with charges and then, the tips can be applied to nanopipette when the encapsulated media flow off under applying electrostatic forces. Since the nano space inside the tips can be refilled, the tips can be permanently used in ideal conditions of no chemical reaction and no mechanical deformation. Molecular dynamics simulations for nanopipette applications demonstrated the possibility of nano-lithography or single-metallofullerene-transistor array fabrication.

Nondestructive measurement of sheet resistance of indium tin oxide(ITO) thin films by using a near-field scanning microwave microscope (근접장 마이크로파 현미경을 이용한 ITO 박막 면저항의 비파괴 관측 특성 연구)

  • Yun, Soon-Il;Na, Sung-Wuk;Yun, Young-Wun;You, Hyun-Jun;Lee, Yeong-Joo;Kim, Hyun-Jung;Lee, Kie-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • pp.522-525
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    • 2004
  • ITO thin films $({\sim}150\;nm)$ are deposited on glass substrates by different deposition condition. The sheet resistance of ITO thin films measured by using a four probe station. The microstructure of these films is determined using a X-ray diffractometer (XRD) and a scanning electron microscope (SEM) and a atomic force microscope (AFM). The sheet resistance of ITO thin films compared $s_{11}$ values by using a near field scanning microwave microscope.

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