• Title/Summary/Keyword: Prediction of occurrence of deffects

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A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory (낸드 플래시 메모리의 불량 발생빈도를 이용한 저장장치의 수명 예측 최적화 방법)

  • Lee, Hyun-Seob
    • Journal of Internet of Things and Convergence
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    • v.7 no.4
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    • pp.9-14
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    • 2021
  • In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.