• Title, Summary, Keyword: device reliability

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Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism

  • Tung, Chih-Hang
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.3 no.3
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    • pp.107-113
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    • 2003
  • Microelectronics device performance and its reliability are directly related to and controlled by its constituent materials and their microstructure. Specific processes used to form and shape the materials microstructure need to be controlled in order to achieve the ultimate device performance. Examples of front-end and back-end ULSI processes, packaging process, and novel optical storage materials are given to illustrate such process-structure-property-reliability relationship. As more novel materials are introduced to meet the new requirements for device shrinkage, such under-standing is indispensable for future generation process development and reliability assessment.

Study on Reliability Assessment for the Medical Device Software from the Viewpoint of Functional Safety (기능 안전 관점에서의 의료기기 소프트웨어 신뢰성 평가 방법에 관한 연구)

  • Kim, Sung Min;Ko, Byeonggak;Do, Gyeong-Hun;Kim, Hye Jin;Ham, Jung-Keol
    • Journal of Applied Reliability
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    • v.16 no.3
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    • pp.216-223
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    • 2016
  • Purpose: This paper suggests the procedure to enhance the reliability of the software of the medical device that is to cure, treat, diagnose, and prevent a disease or an abnormal health conditions. Methods: After test requirements are classified by the software requirements specification for safety and backgrounds, reliability assessment methods are suggested. Results: Verification and validation for function and safety can be performed whether the medical device software are implemented as intended. Conclusion: Procedure on the static analysis, unit test, integration test, and system test are provided for the medical device software.

Bayesian Reliability Estimation for Small Sample-Sized One-shot Devices (작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정)

  • Mun, Byeong Min;Sun, Eun Joo;Bae, Suk Joo
    • Journal of Applied Reliability
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    • v.13 no.2
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    • pp.99-107
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    • 2013
  • One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.

Development of energy saving type life testing device for large machinery parts (에너지절감형 대형기계류부품용 수명시험장치의 개발)

  • Lee, Yong Bum;Shin, Suk Shin;Park, Jong Ho
    • Journal of Applied Reliability
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    • v.13 no.1
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    • pp.55-63
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    • 2013
  • For a reliability assessment of large machinery parts, reliable data should be obtained from testing many samples for a long time. However, in case of testing these samples, testing cost is excessive; in case of life test for long time, power consumption is high; and in case of accelerated test by over load, very high cost is required to build the life testing device. Especially it is very frequent that the expensive device's life has ended during a accelerated test by over load. In this study, the design mechanism of the life testing device which excels in energy saving during the reliability test of large machinery parts has been introduced.

Development and Evaluation of Tip Pinch Strength Measurement on a Paretic Hand Rehabilitation Device

  • Kim, Jung-Yeon;Cha, Ye-Rin;Lee, Sang-Heon;Jung, Bong-Keun
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.11 no.2
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    • pp.1201-1216
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    • 2017
  • In this study, we described the development of a methodology to measure tip-pinch strength on the paretic hand rehabilitation device and aimed to investigate reliability of the device. FSR sensors were embedded on the device, and tip pinch strength was estimated with data collected from the sensors using a developed equation while participants were demonstrating tip pinch. Reliability tests included inter-rater, test-retest, and inter-instrument reliability. B&L Engineering pinch gauge was utilized for the comparison. Thirty-seven healthy students participated in the experiment. Both inter-rater and test-retest reliability were excellent as Intraclass Correlation Coefficients (ICCs) were greater than 0.9 (p<0.01). There were no statistically significant differences in tip-pinch strengths. Inter-instrument reliability analysis confirmed good correlation between the two instruments (r = 0.88, p < 0.01). The findings of this study suggest that the two instruments are not interchangeable. However, the tip-pinch mechanism used in the paretic hand rehabilitation device is reliable that can be used to evaluate tip pinch strength in clinical environment and can provides a parameter that monitors changes in the hand functions.

Various Techniques for Improving of the Reliability of the Wireless Network Design/Optimization Simulation Tool (무선망 설계/최적화 시뮬레이션 툴 의 다양한 신뢰도 향상 기법)

  • Jeon Hyun-Cheol;Ryu Jae-Hyun;Park Sang-Jin;Park Joo-Yeoul;Kim Jung-Chul
    • 한국정보통신설비학회:학술대회논문집
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    • pp.39-42
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    • 2006
  • There are various analysis functions(including prediction of path loss, analyzing of capacity and coverage, etc.) of simulation tool to design and optimize the mobile communication network. Its reliability absolutely effects the performance of mobile communication network. Especially as the wireless network highly advancing focused on data service, it more needs to research and develop on the standard establishment of reliability of the simulation tool. Also it is important the systematic research how to improve the reliability of simulation tool. In this paper, to give the concrete process and skill about how to improve reliability, we define the kinds of reliability at first. And then we explain the comparison results between real field measurement data and theoretic simulation data.

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A Study of Economical Sample Size for Reliability Test of One-Shot Device with Bayesian Techniques (베이지안 기법을 적용한 일회성 장비의 경제적 시험 수량 연구)

  • Lee, Youn Ho;Lee, Kye Shin;Lee, Hak Jae;Kim, Sang Moon;Moon, Ki Sung
    • Journal of Applied Reliability
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    • v.14 no.3
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    • pp.162-168
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    • 2014
  • This paper discusses the application of Bayesian techniques with test data on similar products for performing the Economical Reliability Test of new one-shot device. Using the test data on similar products, reliability test required lower sample size currently being spent in order to demonstrate a target reliability with a specified confidence level. Furthermore, lower sample size reduces cost, time and various resources on reliability test. In this paper, we use similarity as calculating weight of similar products and analyze similarity between new and similar product for comparison of the essential function.

The Solution of Reliability Problem for the Actuator Latch Device of Hard Disk Drive Using TRIZ (트리즈를 활용한 하드디스크 드라이브 액추에이터 래치 장치의 신뢰성 문제 해결)

  • Jeong, Hai Sung
    • Journal of Applied Reliability
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    • v.14 no.3
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    • pp.147-151
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    • 2014
  • An actuator latch device of a hard disk drive is installed for locking an actuator to hold a magnetic head parked in a parking zone. Applying an external force to the drive, the head can move away from the parking zone and destroy data on the disk. A magnet latching mechanism is used to prevent the actuator from moving when the computer is not in use. A permanent magnet holds the actuator when the head is in the parking zone. When the computer is turned on, the actuator has to overcome the latch magnet in order to move. A stronger latch magnet will hold the actuator adequately, but the actuator will not be released when unlocking is required. A breakthrough solution is needed to improve the reliability of the drive without any deterioration of its performance. In order to obtain the idea for resolving this technical contradiction, we analyse patents for actuator latch device of a hard disk drive. A practical way for solving contradictions in product development using TRIZ is proposed in this paper.

Verification for the design limit margin of the power device using the HALT reliability test

  • Chang, YuShin
    • Journal of the Korea Society of Computer and Information
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    • v.23 no.11
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    • pp.67-74
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    • 2018
  • The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.