A-scan 방식을 응용한 초음파 비파괴 검사 장치

An Ultrasonic NDT System using Modified A-scan Method

  • 김건 (연세대학교 전자공학과) ;
  • 서호선 (연세대학교 전자공학과) ;
  • 차일환 (연세대학교 전자공학과)
  • Kim, Kun (Dept. of Electronic Eng. Yonsei University) ;
  • Seo, Ho-seon (Dept. of Electronic Eng. Yonsei University) ;
  • Cha, Il-whan (Dept. of Electronic Eng. Yonsei University)
  • 발행 : 1985.10.01

초록

In most of ultrasonic NDT(Non-Destructive Testing) equipments using A-scan display technic, it is one of the inconveniences that the user must be proficient in reading the displayed signals for the accurate decisions. In this study, a simple microprocessorized NDT machine for the flaw detection was developed. The operation of system is based on the conventional NDT system. The microprocessor detects the time delay between transmitted pulse and echos by counter-measure method. Then according to the scanning position, the location of flaw orthe other side of testing object is plotted on the CRT. The main advantages of the developed system are simplicity in handling, recording capability of measured data, and low cost.

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