Rapid thermal annealing to minimize Slip

슬립현상을 최소화 하기위한 급속열처리

  • 권경섭 (중앙대학교 전자공학과) ;
  • 이범학 (중앙대학교 전자공학과) ;
  • 황호정 (중앙대학교 전자공학과)
  • Published : 1988.07.01

Abstract

In this paper a newly designed rapid thermal process (RTP) structure is proposed to the slip induced in silicon wafers considerably. The reflectors and a graphite radiation were used to compensate the temperature difference causing slip in silicon wafers. From our experiments it is known that slip can be removed during a rapid thermal annealing at high temperature.

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